SPA6100 Semiconductor Parameter Analyzer

SPA6100 semiconductor parameter analyzer has the advantages of high accuracy, wide measurement range, fast and flexible, strong compatibility, etc. The product can support DC current-voltage (I-V), capacitance-voltage (C-V), and high-current and high-voltage pulsed I-V characterization at the same time.

Based on the modular structure design, can help users according to the test needs, flexible selection of measurement unit for upgrading. The product supports up to 1200V voltage, 100A high current, 1pA small current resolution measurements, while detecting multi-frequency AC capacitance measurements in the range of 10kHz to 1MHz.

Equipped with special semiconductor parameter test software, supporting interactive manual operation or combined with the automatic operation of the probe stage, from the measurement setup, execution, results analysis to data management of the entire process, to achieve efficient and repeatable device characterization; can also be used with high and low temperature chambers, temperature control modules, etc., to meet the needs of high and low temperature testing.

Featured Advantages

1. Modular configuration:Flexible configuration of a variety of measurement units, reserved space for upgrades, convenient for later upgrades

2. Graphical interface:Built-in commonly used device templates, can be directly called, and support the output of three modes of test reports

3. Automated testing:Embedded low leakage matrix switch, can automatically switch the test circuit to realize one-key test function

4.Fixture can be customized:Supports diodes, transistors, Si and SiC MOS tubes, IGBTs and other devices

5. Multi-equipment linkage:Can be used with probe stage, temperature control module, etc. Temperature control range: room temperature ~ 250 ℃.

Accelerating the development and validation of semiconductor materials, chip device design and advanced processes

1、Support DC and pulse I-V test

2、Built-in professional matrix switch, improve test efficiency

3, can be used with a variety of equipment linkage: wafer-level chip performance testing needs to be linked with the probe stage, reliability assessment will involve room temperature and high and low temperature conditions.

4、Tri-coaxial cable to enhance the accuracy of small current testing

Graphical software interface

Together with the professional test software developed by Purcell, SPA6100 can easily realize the parameter test of semiconductor materials and devices. The system has built-in templates for commonly used devices, such as diodes, transistors, MOSFETs, which can be directly called up during the test process, and the test parameters can be simply set. The software supports the display of test data and the plotting of curves. After the test is completed, the data and curves can be exported and saved.

Flexible and customizable fixturing solutions

For semiconductor devices of different package types on the market, Purcell provides a complete set of fixture solutions. The fixtures are characterized by low impedance, easy installation and rich variety, and can be used for testing diodes, transistors, FETs, IGBTs, SiC MOS, GaN and other single-tube and module products; they can also be connected with the probe table to realize wafer-level chip testing.

Fixtures for different package types