Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
Function Introduction Video
High-order, high-precision substrate potential defects, accurate detection of each FAIL
High-speed testing with electrostatic capacitance method, Max. 100 points/sec.
:: Combining the latest probes to reduce needle marks
:: Updated software with significant improvements in operability
■ Outline of specifications
| armchair number | 2 (front*2) | |
|---|---|---|
| Probe mountable | 1172 Series, CP1072 Series | |
| Test Steps | 999,999 steps | |
| Measuring parameters and measuring range | Resistance Measurement | 40.00 μΩ ~ 40.00 MΩ |
| Insulation resistance measurement | 1.000 kΩ ~ 500.0 MΩ | |
| Capacitance Measurement | 100.0 fF ~ 10.00 μF | |
| Leakage Current Measurement | 1.000 μA ~ 10.00 mA | |
| High Voltage Resistance Measurement | 1.000 kΩ ~ 500.0 MΩ | |
| Capacitor Insulation Resistance | 1.000 kΩ ~ 10.00 MΩ | |
| Open Circuit Measurement | 4.000 Ω ~ 4.000 MΩ | |
| Short Circuit Measurement | 400.0 mΩ ~ 40.00 kΩ | |
| Scope of determination | -99.9% ~ +999.9%, or absolute value | |
| Comprehensive Positioning Accuracy | □20μm (Note: Limited by inspection conditions) | |
| Minimum distance between measurement points | 50 μm (L-R arm spacing when using probe CP1072-01) | |
| measuring time | Max. 100 steps/sec (0.1mm X-Y movement, 2-arm simultaneous probing Capacitance test) | |
| Testable Substrate Size | 50(W) × 50(H) ~ 610(W) × 510(H)mm, Thickness 0.1mm ~ 3.2mm | |
| Maximum measurable area | 610mm(W) × 510mm(H) | |
| baseboard fixing | Horizontal placement, vacuum adsorption | |
| power supply | AC 200 V, 220 V, 230 V, 240 V single-phase (specified when ordering) 50/60 Hz, max. power consumption: 3 kVA | |
| Volume and weight | 1303(W) × 1194(H) × 1167(D)mm±10mm (excluding protruding parts) 900 kg±50kg | |
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