EM5030 (30MHz to 3GHz) High Frequency Magnetic Field Probe

EM5030/EM5030LF SeriesThe probe set contains seven probes dedicated to testing magnetic field (H) probes, which are effectively shielded against electric field interference (E) and are mainly used as near-field probes for locating sources of interference during EMC rectification.The EM5030 has a frequency range of 30MHz-3GHz in four probe shapes and the EM5030LF has a frequency range of 9kHz-50MHz in three probe shapes.

EM5030E SeriesThe probe set consists of 2 probes specifically designed to test electric fields (E), covering the frequency range from 30MHz to 3GHz, and is mainly used to find sources of E-field interference, except for the probes, which are all shielded.

The probe is connected directly to a spectrum analyzer or oscilloscope via a 50Ω cable. When the radiated or conducted interference of the product exceeds the standard, the near-field probe can be used to find out which components or circuits in the product are generating the interference at that frequency, and it can detect the coupling channel between the modules as well as evaluate the signal switching rate, RF voltage, etc. in the system. When the interference signal is weak, it can be combined with our EM5020A (20dB gain) or EM5020B (30dB gain) preamplifier to improve the system test sensitivity.