Search ProductsSearch Articles
Memristor basic performance research specializing in semiconductor electrical performance testing Based on the classical circuit theory, there are four basic circuit physical quantities, namely, current (i), voltage (v), charge (q) and magnetic flux (o). According to these four basic physical quantities, six mathematical relationships can be derived theoretically, while defining three basic...
GaN HEMT RF Device Parameter Test Focus on Semiconductor Electrical Performance Test Overview-RF RF device is the realization of the signal transmission and reception of the basic components, is the core of wireless communications, mainly including filters (Filter), power amplifiers (PA), RF switches (Switch), low-noise amplifiers (...
For photodetector single sample testing and multi-sample verification testing, complete test programs can be built directly from a single digital source meter, multiple digital source meters or plug-in source meters.
High Power Laser Aging Tests Specializing in Semiconductor Electrical Performance Tests High power semiconductor lasers and high power semiconductor laser pumped lasers are used in the civilian fields of material processing, laser marking, laser ranging, laser storage, laser display, laser illumination, laser medical treatment, etc., as well as in laser...
VCSEL Laser LIV Test Specializing in Semiconductor Electrical Performance Testing Overview Vertical Cavity Surface Emitting Laser (VCSEL) is a kind of semiconductor laser in which the laser emission direction is perpendicular to the plane of the P-N junction and the resonant cavity plane is parallel to the plane of the P-N junction, which belongs to a kind of surface-emitting lasers. The EEL side...
Power Devices (IGBT) Static Parameter Tests Specializing in Semiconductor Electrical Performance Tests Overview SiC/IGBT and its application development IGBT (Insulated Gate Bipolar Transistor) is the core device of power control and power conversion, is composed of BJT (Bipolar Transistor) and MOS (Insulated Gate Field Effect Tube) of a compound...
Input/output characteristic test, inter-pole reverse current test, reverse breakdown voltage test, and C-V test are usually concerned in the electrical performance test of transistors, and this program introduces in detail the program of electrical performance test of transistors by using a digital source meter.
MOSFET I-V Characterization Specializing in Semiconductor Electrical Performance Testing MOSFET (Metal-Oxide Semiconductor Field Effect Transistor) is a common semiconductor device that uses the electric field effect to control the magnitude of its current, and can be widely used in analog circuits and digital...
Shenzhen Wanbo Instrumentation Co., Ltd-Pulse independently developed high-precision source meters, pulse constant current sources, high-voltage power supplies and other special benchtop instruments, with high precision, high efficiency, wide range of applications, to fill the gaps in the domestic market of source meters, the first to achieve the localization of substitution and industrialization.
Product consultation and purchase：18218718851
ABOUT US
Dedicated customer line:
13717737785
Business Negotiations:
18929381667
Contact Email:
fp@szwanbo.com
WeChat Customer Service:
Add Commissioner WeChat
Add Commissioner WeChat
Contact our technical support specialists
In order for us to serve you better, please leave your valuable information.
If you need to purchase a specific model, you can filter the product center to select the model and submit an inquiry, fill in the specific number of products, our account manager will immediately give you the most favorable wholesale price!
If you don't find a model you can leave a comment here and we'll do our best to find it for you!
Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.