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  • Purcell PL Series LIV Narrow Pulse Test System Enables More Efficient and Reliable VCSEL Test Applications

    VCSEL Laser LIV Test Specializing in Semiconductor Electrical Performance Testing Overview Vertical Cavity Surface Emitting Laser (VCSEL) is a kind of semiconductor laser in which the laser emission direction is perpendicular to the plane of the P-N junction and the resonant cavity plane is parallel to the plane of the P-N junction, which belongs to a kind of surface-emitting lasers. The EEL side...

  • Purcell IGBT power device static parameter test solution

    Power Devices (IGBT) Static Parameter Tests Specializing in Semiconductor Electrical Performance Tests Overview SiC/IGBT and its application development IGBT (Insulated Gate Bipolar Transistor) is the core device of power control and power conversion, is composed of BJT (Bipolar Transistor) and MOS (Insulated Gate Field Effect Tube) of a compound...

  • Purcells Digital Source Meter for Fast, Accurate Triode (BJT) Characterization

    Input/output characteristic test, inter-pole reverse current test, reverse breakdown voltage test, and C-V test are usually concerned in the electrical performance test of transistors, and this program introduces in detail the program of electrical performance test of transistors by using a digital source meter.

  • Application of high-precision digital source meter (SMU) in diode characterization parameter analysis

    Shenzhen Wanbo Instrumentation Co., Ltd-Pulse independently developed high-precision source meters, pulse constant current sources, high-voltage power supplies and other special benchtop instruments, with high precision, high efficiency, wide range of applications, to fill the gaps in the domestic market of source meters, the first to achieve the localization of substitution and industrialization.

  • GaN HEMT RF device parametric testing

    GaN HEMT RF Device Parameter Test Focus on Semiconductor Electrical Performance Test Overview-RF RF device is the realization of the signal transmission and reception of the basic components, is the core of wireless communications, mainly including filters (Filter), power amplifiers (PA), RF switches (Switch), low-noise amplifiers (...

  • Purcell IGBT power device static parameter test solution

    Seth IGBT power device static parameter test system, integrating a variety of measurement and analysis functions, can accurately measure the static parameters of IGBT power semiconductor devices, with high voltage and high current characteristics, μΩ level accurate measurement, nA level current measurement capability and other characteristics.

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