Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
Advanced exterior design
Whether in R&D or on a modern production line, the SNA5000A's forward-looking design saves engineers or production lines a lot of desktop space, unlike traditional bulky vector network analyzers.
Time domain analysis function and eye diagram function
In the microwave RF field, it is a major challenge to effectively eliminate harmful test fixture effects. For example, when testing SMD devices, specific test fixtures are needed to realize the transfer between the test end of the test instrument and the input end of the device, resulting in test results that include the characteristics of the test fixtures. Currently, the SNA5000A series provides the following methods to remove test fixture effects: port extension, port matching, port impedance conversion, de-embedding, adapter removal, and so on.
In addition, the SNA5000A series supports the TDR time-domain reflectometer measurement function, which analyzes the characteristic impedance, time delay and other parameters of the transmission line in the time domain.
In addition, the SNA5000A series supports the TDR time-domain reflectometer measurement function, which analyzes the characteristic impedance, time delay and other parameters of the transmission line in the time domain.
Accurate characterization and measurement of dielectric properties of materials
Tingyang Technology's complete solution for material measurement, including SNA series vector network analyzers, MT Material Measurement Analysis Software, KWR42A waveguide calibrators and fixtures, helps users to efficiently and accurately characterize and measure the dielectric properties of materials.The SNA series vector network analyzers combine excellent measurement integrity and affordability with measurement wizards to guide users through the material measurement process. Measurement results can be plotted in a variety of formats to help you better analyze your measurements, making them ideal for laboratories, research institutes, and educational environments.
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Gain Compression Measurement
Compression and linear parameters such as linear gain, compression point gain, compression point input/output power, etc. of active devices in the operating band are measured through one connection and one calibration. Power calibration and calibration wizard to ensure the measurement accuracy, support a variety of scanning methods, including intelligent scanning, power scanning at each frequency point and frequency scanning at each power point to adapt to different test scenarios, and provide a variety of compression methods, such as linear compression, maximum gain compression, regression compression, X/Y compression, saturation compression and other compression methods, so that it can flexibly respond to the complex testing needs, and ensure a comprehensive and accurate characterization of the device. Non-linear behavior of the device
Scalar/Vector Mixer Measurements
It supports various scanning modes such as linear scan, power scan, segment scan, etc., and allows flexible setting of parameters such as source port power, local oscillator port power and attenuation. The four-port model has a built-in dual signal source, allowing the second source to be used as a local oscillator or to provide a local oscillator signal by controlling an external signal generator. An intuitive user interface allows easy measurement configuration, and a calibration wizard guides the user through the calibration process, providing comprehensive and accurate mixer characterization measurements.
Easily Realize Multi-Port Device Testing Needs
The SSM5000A series of switching matrices make it easy to test multi-port devices with a frequency range of 9kHz~26.5GHz, which is compatible with all of DYNAM's vector network products, and a single unit can expand the output ports up to 24 ports, which is a great match for automated test systems and production line scenarios.The multi-port measurement capability of the SSM5000A series can increase the throughput of testing and thus significantly reduce the cost of device testing. Typical applications include automated test of antenna arrays, data converter interfaces, RF components and other devices for design, verification and production.
| model number | Output frequency range | port number | frequency resolution | Amplitude resolution | IF bandwidth range | Output power setting range | dynamic range |
|---|---|---|---|---|---|---|---|
| SNA5032A | 100 kHz-26.5 GHz | 2 | 1Hz | 0.05dB | 1 Hz~10 MHz | -55 dBm ~ +10 dBm | 125dB |
| SNA5022A | 100 kHz-13.5 GHz | 2 | 1Hz | 0.05dB | 1 Hz~10 MHz | -55 dBm ~ +10 dBm | 125dB |
