Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
Micsig's MOIP series of optical isolation probes range from 100MHz to 1GHz and can measure differential mode signals from ±0.01V to ±6250V. Based on the exclusive SigOFIT™ leading technology, the MOIP series has a very high common mode rejection ratio of up to 108dB at 1GHz, isolation voltage of up to 85kV, and a noise floor of less than 0.45mVrms, which provides insight into the full truth of the signal within its bandwidth, and is the ultimate arbiter of the authenticity of signals measured by other voltage probes.
MOIP series adopts advanced laser power supply technology, laser signal transmission, laser power transmission (no battery, more pure power supply), 365 days of uninterrupted testing, standard BNC interface, adaptable to all brands of oscilloscopes; seconds of self-calibration, no need to wait, power on the test, without warming up, high stability, temperature drift is very small, accuracy better than 1%, can be switched between 0dB and 20dB, making a single attenuator also has two ranges to improve the signal-to-noise ratio; input capacitance of only 1pF, measuring gallium nitride (GaN) without blowing the tube, attenuator and fiber length can be customized. Make a single attenuator also has two ranges to improve the signal-to-noise ratio; input capacitance of only 1pF minimum, measurement of gallium nitride (GaN) does not blow up the tube, attenuator and fiber length can be customized, can be used to measure SiC/GaN and other power devices, such as the gate voltage drive and other high-voltage and high-frequency challenging scenarios.
The truest signal presentation
The SigOFIT Optical Isolation Probe has an extremely high common mode rejection ratio, with a CMRR of up to 128dB at 100MHz and still up to 108dB at 1GHz, making it the ultimate arbiter of the authenticity of signals measured by other voltage probes.
Extremely high test accuracy and stability
As the ultimate judge of the authenticity of signals measured by other voltage probes, test accuracy is an important indicator of SigOFIT optical isolation probes, which have excellent amplitude-frequency characteristics, DC gain accuracy of better than 1%, noise floor of less than 0.45mVrms, zero drift after warm-up for 5min of less than 0.1%, gain drift of less than 1%.
Optimal Test Means for Third Generation Semiconductors
Third-generation semiconductor devices due to the short on and off time, the signal has a faster rising edge and falling edge, the signal has a high energy of high-frequency harmonics, SigOFIT optical isolation probe in the highest bandwidth, but still has a common mode rejection ratio of more than 100dB, can be nearly perfect suppression of high-frequency common-mode noise generated by the oscillation of the signal presented by the signal without additional redundant components, it is the third-generation semiconductor It is the perfect choice for third-generation semiconductor testing.
Testing Gallium Nitride (GaN) without Blowing Tubes
SigOFIT opto-isolated probes are safe for testing Gallium Nitride (GaN) with short test leads and coaxial transmission and a minimum probe input capacitance of only 1pF.
Flexible, efficient and easy to use
SigOFIT optical isolation probe than the traditional high-voltage differential probe volume is smaller, the probe lead is more compact, more flexible and convenient to use; probe response is fast, power on that is measured, the calibration time is less than 1 second, calibration, without the need to disconnect the test connection, can be real-time to ensure that the accurate signal output.
True Optical Isolation Technology
Transmitting signal with laser + transmitting power with laser (no batteries, purer power supply) for 365 days of uninterrupted testing.
Wider test range
Unlike high-voltage differential probes that can only test high-voltage signals, SigOFIT optical isolation probes can test differential mode signals from ±0.01V to ±6250V by matching different attenuators and achieve full-scale output to achieve a high signal-to-noise ratio.
application scenario
The SigOFIT Optical Isolation Probe can be used as the final arbiter when there is a question as to the accuracy and veracity of the results measured by other voltage probes.
Power Supply Device Evaluation, Current Parallel Measurement, EMI and ESD Troubleshooting
Motor drive design, power converter design, electronic ballast design
Design and analysis of Gallium Nitride, Silicon Carbide, and IGBT half/full bridge devices
Secure Isolation Testing for High Voltage High Bandwidth Test Applications
Testing of inverters, UPS and switching power supplies
Wide voltage, wide bandwidth test applications
Various Floating Ground Tests
| model number | MOIP100P | MOIP200P | MOIP350P | MOIP500P | MOIP800P | MOIP1000P |
|---|---|---|---|---|---|---|
| bandwidths | 100MHz | 200MHz | 350MHz | 500MHz | 800MHz | 1GHz |
| rising time | ≤3.5ns | ≤1.75ns | ≤1ns | ≤700ps | ≤500ps | ≤450ps |
| Common mode rejection ratio | DC: 180dB 100MHz: 128dB |
DC: 180dB 200MHz: 122dB |
DC: 180dB 350MHz: 118dB |
DC: 180dB 500MHz: 114dB |
DC: 180dB 800MHz: 110dB |
DC: 180dB 1GHz: 108dB |
| Test Voltage Range | Standard OP20 (MMCX), ±25V Optional OP50 (MMCX), ±62.5V Optional OP200(MCX), ±250V Optional OP1000(MCX), ±1250V Optional OP2000 (MCX), ±2500V Optional OP5000(LCX), ±6250V |
Standard OP20 (MMCX), ±25V Optional OP50 (MMCX), ±62.5V Optional OP200(MCX), ±250V Standard OP1000 (MCX), ±1250V Optional OP2000 (MCX), ±2500V Optional OP5000(LCX), ±6250V |
Optional OP20 (MMCX), ±10V Standard OP50 (MMCX), ±25V Optional OP100 (MMCX), ±50V (MOIP500P only) Standard with OP2000 (MCX), ±1000V Optional OP5000(MCX), ±2500V Optional OP10000(LCX), ±5000V |
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| bottom noise | <0.45mVrms | |||||
| DC Gain Accuracy | 1% | |||||
| common-mode voltage (electronics) | 85kVpk | |||||
| Oscilloscope Side Interface | Universal standard BNC connector, can be used with all brands of oscilloscopes | |||||
