IT8700P Series Multi-Input Programmable DC Electronic Load

♦ 抽换式模组，可自由搭配所需的测试方案;
♦ 双通道模块可同时显示每一通道数据无需切换
♦ 单个机框可达8个通道，扩展机框可达16通道;
♦ 双通道负载模块具有动态功率分配功能，大幅节约设备成本
♦ 前/后接线端子任意选择
♦ 用户可以自行定制模组左右顺序
♦ 8种操作模式：CC/CV/CR/CW/CV+CC/CR+CC/CW+CC/CV+CR(CR-LED)
♦ CV loop speed adjustable to match different power supplies
♦ 高达0.1mV/0.1mA的解析度和高精度
♦ 具有短路峰值电流和峰值电压的测量功能
♦ 电压、电流测量速度可达50kHz
♦ 可调整电流上升/下降斜率
♦ 在List模式下，可模擬各种带载波形
♦ 高达25kHz的动态模式，100kHz的List模式设置速度
Automatic test function, can automatically determine whether the test results are out of the set specifications
Simultaneous execution of multiple electronic load module pulls
♦ OVP/OCP/OPP/OTP/防反接保护功能
♦ 内置LAN/USB/RS232通信接口

Front/rear terminals available to meet a wide variety of options

The IT8700P is equipped with both front and rear terminals, and both front and rear panels can be wired for testing, which meets users' diverse testing needs and also avoids operational errors and improves testing efficiency. At the same time, the IT8700P is only 4U in height, which makes the product more in line with the standard cabinet requirements, and increases the compatibility of system integration.

Eight operating modes

IT8700P series in the original CC/CV/CR/CW four basic operating modes on the basis of the addition of four new composite operating modes: CV + CC/CR + CC/CW + CC/CV + CR (CR-LED), in the CV/CR/CW fixed-state operating mode to increase the CC current limit value (I-Limit) setting can help engineers to effectively solve the problem of transient surge current in applications, to avoid the object to be tested to trigger protection or even burn out, can be adapted to the needs of a variety of occasions. It can help engineers to effectively solve the problem of instantaneous surge current in applications, avoiding the triggering of protection or even burnout of the object to be tested, which can be adapted to the testing needs of a variety of occasions.

Freely configurable modular system structure

The IT8700P series adopts the design of interchangeable modules, so that users can choose modules freely according to their needs. Moreover, each load module and main control module unit has a high-performance microprocessor chip. The parallel architecture between them provides high test speed. The load modules are controlled synchronously by the system, and power supplies with multiple outputs can also be tested synchronously.

Dynamic power distribution mode

Dual-channel IT8700P series, with dynamic power allocation function, in the test application can greatly save the cost of purchasing equipment. IT8700P series module in the total power does not exceed 300W, single channel does not exceed 250W under the premise that the power can be freely allocated to the use of the two channels, rather than the traditional sense of the limited channel power allocation, the user can be based on the test requirements, the two load power within the module to adjust to the required power ratio, so that the load power utilization has never reached the optimal point. Users can adjust the power of the two loads in the module to the required power ratio according to the test requirements, so that the load power utilization has never reached the optimal point. For example, when you need 130W+170W or 50W+250W dual-channel loads, the IT8700P series can be accomplished with only a single module.

With ITECH test system

IT8700 can be used with ITECH power supply, battery internal resistance tester and temperature collector to form ITS5300 battery test system, which can realize up to hundreds of channels running at the same time, real-time recording of voltage, current and other waveforms, and test data can be exported to EXCEL.

The IT8700 can also be used with ITECH AC/DC power supplies, relay cards, I/O cards, DSO cards, etc. to form the ITS9500 power supply test system, which realizes simultaneous testing of multiple power supply modules or testing of multiple output AC/DC or DC/DC power supply modules.

IT8700 with IT9380 software can realize the multi-channel test of solar cells, and the test interface of each channel can be freely switched to support the setting of sampling time and the export of test data. Together with the IT8700's I-V sampling rate of up to 50KHz, the IT8700 realizes the high-efficiency and fully automated test of solar panels.