Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
High pulse fidelity without manual pulse adjustment
The 2601B-PULSE control loop system eliminates the need to manually adjust for load variations of up to 3 μH, ensuring that pulses are free of overshoot and oscillation when outputting 10 μs to 500 μs pulses at any current level (up to 10 amps). Pulse rise times of < 1.7 μs ensure that you can properly characterize the device or circuit under test.
- Output 10 A @ 10 V, pulse width 10 μs
- Pulse rise time <1.7μs for easy calibration
- High fidelity pulse output with no adjustment at any current level
Integration of fast pulse generator functionality with SMU functionality in a single instrument
The 2601B-PULSE adds pulse generator capability to the measurement integrity, synchronization, speed and accuracy provided by the industry-leading Keithley 2601B SMU instrument.
- Basic measurement accuracy of 0.05% for pulse generators with 1 MS/s digitizing function
- SMU 100 nA low current range with 100 fA sensitivity
- Rear panel BNC connection for quick cable setup
Embedded Scripting and Connectivity Provides Unrivaled Production Throughput
Test Script Processor (TSP®) technology embeds and executes complete test programs within the SMU instrument, delivering industry-best performance, and TSP-Link® technology supports the expansion of up to 32 TSP link nodes to create high-speed, SMU-Per-Pin parallel tests without the use of a host computer.
- Eliminates time-consuming bus communication with PCs
- Advanced data processing and flow control
- Connects up to 32 TSP link nodes
- Easy reconfiguration as test requirements change
| model number | conduit | Maximum Current Source/range (of scales or measuring equipment) | Maximum Voltage Source/range (of scales or measuring equipment) | Measurement resolution (current)/(Voltage) | power supply | quote |
|---|---|---|---|---|---|---|
| 2601B-PULSE | 1 | 10 A | 40 V | 100 fA / 100 nV | Pulser: 100 W instantaneous SMU: 200 W instantaneous | US $19,300 |
Laser Diode (VCSEL) Production Testing for ToF/LIDAR Applications
The 2601B-PULSE is the ideal solution for LIV production testing of laser diode vertical cavity surface emitting lasers (VCSELs), featuring a high-speed, high-precision 10µs pulse generator and SMU for current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules.The SMU provides the most cost-effective LIV instrumentation available, with high system synchronization and throughput. SMUs provide the most affordable LIV instrumentation with high system synchronization and throughput.
- Programmable pulsed current source up to 10 A current and 10 µs pulse width
- Voltage and current measurement resolutions of 100 nV and 100 fA
- Built-in TSP® processing reduces PC and instrument bus communication
How to Generate 10 µs Pulses with the 2601B-PULSE System SourceMeter SMU Instrument The new Current Pulse Generator/SMU eliminates the need for time-consuming manual timing when outputting pulses as low as 10 µs!
Failure analysis and quality assurance
Semiconductor companies and semiconductor researchers are constantly looking for ways to keep test equipment from being a hindrance to their breakthroughs in the semiconductor field. Semiconductor failure analysis (FA) engineers spend countless hours trying to understand why equipment fails and how to prevent it in the future.
- Simplify FA Processes with SMU and Pulse Testing
- Digital I/O Triggers External IR Camera
- Built-in timer function with 1μs resolution and ±100 ppm accuracy.
Advanced techniques for failure analysis using source measurement units and lock-in thermography
Simplified LED Pulsed/DC I/V Accreditation
The 2601B-PULSE's unique current pulse, DC voltage and current functions enable high-speed LED DC and pulse IV Accreditation and production testing with a basic measurement accuracy of 0.015%. Performing pulse tests on microLEDs, LEDs, or high brightness LEDs (HBLEDs) minimizes self-heating and reduces the negative impact on measurement accuracy, plus there is no need to worry about damaging the device under test.
- Programmable current source up to 10 A current and 10 µs pulse width
- Voltage and current measurement resolutions of 100 nV and 100 fA
- 1 M sample point/second digitizer for fast data acquisition and measurement
- Built-in TSP processing reduces PC instrument bus communications
Wafer Semiconductor Testing
The Keithley 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of stacked rack instruments with the integration and high throughput of host-based systems, using TSP and TSP link technology to reduce manufacturing activities and test costs. These instruments are typically used for wafer semiconductor testing of laser diodes, LEDs, transistors, and more.
- Built-in TSP processing reduces PC instrument bus communications
- TSP-Link up to 32 instruments can be synchronized with other Keithley TSP instruments within 500 ns
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