TH2638 series high-speed precision capacitance measuring instrument is a new type of capacitance measuring instrument with up to 1MHz testing frequency, small size, compact and portable, easy to use on the shelf. 4.3-inch LCD screen can be selected from the English operation interface, easy and fast operation.
TH2638系列测量电容基本精度为±0.07%,损耗精度高达0.0005,最高速度高达2.3ms;超宽的量程配置,使得TH2638系列能够精确测量从低值到高值的各类电容;超宽的输出阻抗范围和信号电平补偿功能,特别适合于用稳定的测试电平高速高精度测试陶瓷电容器;三参数(Cs-Rs-Ls)测试功能解决了新能源汽车用DC-Link薄膜电容器串联等效电感ESL的测试难题。
TH2638系列兼容SCPI命令集;有机械手接口和料箱分类功能,适合生产线高速测试产品的自动分类;最多256个扫描通道的扫描器接口,大大提高生产效率;不良接触的检查功能大大减低了生产线快速测试时的误判率;当测试频率为1MHz时,频率偏移设置功能(1MHz±1%,1MHz±2%)可消除阵列式电容器测试系统中相邻测量终端的干扰,并降低测量结果的波动。
可以根据不同尺寸的DC-Link薄膜电容器为客户定制相应的测试夹具。
TH2638系列高速精密电容测试仪包括以下几种类型:
| Summary parameters | TH2638 | TH2638A | TH2638B | TH2638C |
| Test Frequency | 100Hz,120Hz,1kHz,10kHz,100kHz,1MHz,1MHz±1%,1MHz±2% | 100Hz,120Hz,1kHz,10kHz,40kHz,100kHz | 100Hz,120Hz,1kHz,10kHz | 100Hz,120Hz,1kHz |
| Basic precision | C:0.07%,D:0.0005 | |||
| test level | 0.1Vrms-1Vrms | |||
| Output Impedance | 1.5Ω、0.5Ω、0.3Ω、10Ω | |||
Functional Features
高速度,高精度,高一致性
测试速度:2.3ms(100kHz/1MHz),3.0ms(1kHz/10kHz/40kHz),11.0ms(120/100Hz)
电容测试精度:±0。07%,损耗因素:±0。0005
18个量程配置,3倍于传统LCR的量程的紧密配置,保证了高速测试下仍能保证高精度和高一致性
| TH2638 | l | l | l | l | l | |
| TH2638A | l | l | l | l | l | |
| TH2638B | l | l | l | |||
| TH2638C | l | l | ||||
| frequency range | 100Hz、120Hz | 1kHz | 10kHz | 40kHz | 100kHz | 1MHz |
| 1pF | l | |||||
| 2.2pF | l | |||||
| 4.7pF | l | |||||
| 10pF | l | l | ||||
| 22pF | l | l | l | |||
| 47pF | l | l | l | |||
| 100pF | l | l | l | l | l | |
| 220pF | l | l | l | l | l | |
| 470pF | l | l | l | l | l | |
| 1nF | l | l | l | l | l | |
| 2.2nF | l | l | l | l | ||
| 4.7nF | l | l | l | l | ||
| 10nF | l | l | l | l | l | |
| 22nF | l | l | l | l | l | |
| 47nF | l | l | l | l | l | |
| 100nF | l | l | l | l | l | |
| 220nF | l | l | l | l | l | |
| 470nF | l | l | l | l | l | |
| 1μF | l | l | l | l | l | |
| 2.2μF | l | l | l | l | ||
| 4.7μF | l | l | l | |||
| 10μF | l | l | l | |||
| 22μF | l | l | ||||
| 47μF | l | l | ||||
| 100μF | l | l | ||||
| 220μF | l | |||||
| 470μF | l | |||||
| 1mF | l |
测试速度和量程的设置,解决了以下几个问题
1. 高速测试下精度及无法得到保证
2. 测量仪器无法满足高吞吐率自动化设备的测试要求
3. 在满足了测试速度的情况下,多次测试数据的一致性不好
从低电容值到高电容值,超宽的测量范围
| Test Frequency | Measurement range |
| 1MHz | 0.001fF-1.5nF |
| 100kHz | >6.8pF |
| 40kHz | >15pF |
| 10kHz | >68pF |
| 1kHz | >68pF |
| 100Hz/120Hz | >6.8nF |

新能源汽车用DC-Link薄膜电容器的精确测试
三参数(Cs-Rs-Ls)测试功能解决了新能源汽车DC-Link薄膜电容器串联等效电阻(ESR)和串联等效电感(ESL)的测试难题。随着工业的迅速发展,能源短缺已成为世界性问题,新能源汽车已成为未来汽车工业发展的主要方向。电机,电池和电机控制技术是新能源汽车的三大核心。电机控制技术的核心就是需要高效电机控制的逆变器技术,高效电机控制的逆变器技术则需要一个功能强大的IGBT模块和一个与之匹配的DC-Link电容器。如下图所示:

DC-Link薄膜电容的特点:
- 容量高,可高达1000μF甚至更高
- 频率特性稳定,产品高频特性好,工作频率约为10kHz
- 低ESR(串联等效电阻),最小可达0.2-0.5mΩ,甚至更小,通过耐纹波电流能力强
- 低ESL(串联等效电感),最低可达<10nH,减小了在开关频率下的震荡效应,因此可忽略掉吸收电容.
- 产品安全性好,耐过压能力强,抗浪涌电压能力大于1.5倍的额定电压
- 没有极性,能承受反向电压
- 额定电压可达800V以上,不需要串联和平衡电阻
如何正确快速测试DC-Link是一个世界性的难题,TH2638A是同惠在电容测试行业20多年的技术积累的基础上,创造性的发明了一个频率下同时测量Cs、ESR和ESL的技术,此技术使得DC-Link电容可以在设定的频率下稳定测试高达1mF的容量、1μΩ稳定值的ESR、0.01nH稳定值的ESL,完美的解决了这个问题,为广大DC-Link电容器厂家提供了一个高效,高性价比的完美解决方案.

低阻抗测试,信号电平补偿功能

低输出阻抗:最低至0.3Ω的低输出阻抗,可高速、精确测试大电容甚至是超级电容。
| Output Impedance | 100Hz/120Hz | SLC OFF(≥220μF量程) | 1.5Ω |
| SLC ON(≥220μF量程) | 0.3Ω | ||
| 10nF-100μF量程 | 10Ω | ||
| 1kHz | SLC OFF(≥22μF量程) | 1.5Ω | |
| SLC ON(≥220μF量程) | 0.3Ω | ||
| 220nF-10μF量程 | 0.3Ω | ||
| 100pF-100nF量程 | 10Ω | ||
| 10kHz | ≥2.2μF量程 | 1.5Ω | |
| 100pF-1μF量程 | 10Ω | ||
| 40kHz | 所有量程 | 10Ω | |
| 100kHz | 所有量程 | 10Ω | |
| 1MHz | 所有量程 | 10Ω |

接触检查功能及同步信号源功能
-
-
- 接触检查,无需额外时间,只有在测试时才输出信号.保证测试数据正确有效及避免长时间接触造成接触不良

- 接触检查,无需额外时间,只有在测试时才输出信号.保证测试数据正确有效及避免长时间接触造成接触不良
同步信号输出,保证测试线上多台同类仪器用同一时基同步测试
-

频率偏移设置
1MHz测试频率可偏置为:1MHz-2%、-1%、+1%和+2%。
当需将两台或多台电容表集成到一个自动机械手系统(例如阵列式电容器测试系统)、或者同一个工作台时,用频率偏移设置功能将多台仪器设置不同频率,可有效消除相邻测量终端之间的相互干扰,及降低测量结果的波动。
扫描仪接口和料箱分类
料箱分类:按照产品的质量设置9个料箱根据C-D/Q/R/G的测试结果确定产品

兼容SCPI指令集,丰富的接口
配附件

| model number | TH2638 | TH2638A | TH2638B | TH2638C | ||||
| Test Signal Parameters | Cp-D, Cp-Q, Cp-Rp, Cp-G, Cs-D, Cs-Q, Cs-Rs | Cp-D, Cp-Q, Cp-Rp, Cp-G, Cs-D, Cs-Q, Cs-Rs, Cs-Rs-Ls | Cp-D, Cp-Q, Cp-Rp, Cp-G, Cs-D, Cs-Q, Cs-Rs | |||||
| test signal | ||||||||
| frequency | Permissible frequency | 100Hz, 120Hz, 1kHz, 10kHz, 100kHz, 1MHz,
1MHz±1%, 1MHz±2% |
100Hz, 120Hz, 1kHz, 10kHz, 40kHz, 100kHz | 100Hz, 120Hz, 1kHz, 10kHz | 100Hz, 120Hz, 1kHz | |||
| accurate | ±0.02% | |||||||
| power level (elec.) | realm | 0.1V-1V | ||||||
| resolution (of a photo) | 0.01V | |||||||
| accurate | ±5% | |||||||
| output method | Continuous or synchronized | |||||||
| signal source delay | realm | 0-1s | ||||||
| resolution (of a photo) | 0.1ms | |||||||
| Output Impedance | 100Hz
120Hz |
SLC OFF | range (of scales or measuring equipment) | ≥220μF | 1.5Ω | |||
| SLC ON | range (of scales or measuring equipment) | ≥220μF | 0.3Ω | |||||
| range (of scales or measuring equipment) | 10nF-100μF | 10Ω | ||||||
| 1kHz | SLC OFF | range (of scales or measuring equipment) | ≥22μF | 1.5Ω | ||||
| range (of scales or measuring equipment) | ≥22μF | 0.3Ω | ||||||
| SLC ON | range (of scales or measuring equipment) | 220nF-10μF | 0.3Ω | |||||
| range (of scales or measuring equipment) | 100pF-100nF | 10Ω | ||||||
| 10kHz | range (of scales or measuring equipment) | ≥2.2μF | 1.5Ω | ------ | ||||
| range (of scales or measuring equipment) | 100pF-1μF | 10Ω | ------ | |||||
| 40kHz | ------ | 10Ω | ------ | ------ | ||||
| 100kHz | 10Ω | ------ | ------ | |||||
| 1MHz | 10Ω | ------ | ------ | ------ | ||||
| test speed | Five test speed options: 1, 2, 4, 6, 8 | |||||||
| Maximum measurement speed | 100Hz/
120Hz |
11ms | ||||||
| 1kHz
10kHz |
3.3ms | |||||||
| 40kHz | ------ | 3ms | ------ | ------ | ||||
| 100kHz | 2.5ms | ------ | ------ | |||||
| 1MHz | 2.3ms | ------ | ------ | ------ | ||||
| Test range method | Automatic, Hold | |||||||
| Average number of times | 1-256 | |||||||
| trigger method | Internal, manual, external, bus | Internal, manual, external (except SCANER), bus (except GPIB) | ||||||
| Trigger delay time | realm | 0-1s | ||||||
| resolution (of a photo) | 0.1ms | |||||||
| Measurement display range | ||||||||
| parameters | Cs, Cp | ±1.000000aF - 999.9999EF | ||||||
| D | ±0.000001 - 9.999999 | |||||||
| Q | ±0.01 - 99999.99 | |||||||
| Rs, Rp | ±1.000000aΩ - 999.9999EΩ | |||||||
| G | ±1.000000aS - 999.9999ES | |||||||
| Δ% | ±0.0001% - 999.9999% | |||||||
| Basic Measurement Accuracy | C:0.07%, D:0.0005 | |||||||
| Display mode | Floating/fixed decimal point display, ΔABS, Δ% | |||||||
| List Scanning | 10-point list scanning for frequency and voltage | |||||||
| Comparator Functions | 11 gears: BIN1-BIN9, OUT_OF_BIN, AUX_BIN | |||||||
| connector | RS232C, LAN, USB HOST, USB DEVICE, HANDLER, GPIB, SCANNER | RS232C, LAN, USB HOST, USB DEVICE, HANDLER | ||||||
| internal storage | 40 instrument setup files | |||||||
| External USB storage | -GIF images -40 instrument setting files -Test data stored directly in USB memory -Screenshot files saved directly to USB memory | |||||||
| General technical indicators | ||||||||
| Temperature, humidity, altitude
(operating environment) |
0°C - 45°C, 15% - 85% RH (≤40°C, non-condensing), 0 - 2000m | |||||||
| Power supply | input voltage | 90VAC - 264VAC | ||||||
| frequency | 47Hz - 63Hz | |||||||
| power wastage | Maximum 150VA | |||||||
| Temperature, humidity, altitude (storage environment) | -20°C - 70°C, 0 - 90% RH (≤65°C, non-condensing), 0 - 4572m | |||||||
Note: 1. 1MHz contains 1MHz ± 1%, 1MHz ± 2% 2. a: 1e-18, E: 1e18
■ 测试频率:100Hz、120Hz、1kHz、10kHz、40kHz、100kHz
■ 串联等效电感Cs-Rs-Ls测试技术
■ 超稳定的ESR ,0.001μΩ读数分辨率
■ Test capacitance basic accuracy ±0.07%, loss factor: ±0.0005
■ Maximum test speed: 2.3ms/time, with five speeds to choose from
■ 4.3-inch TFT liquid crystal display, Chinese and English optional operation interface
■ Low impedance test, signal level compensation function
■ Measurement data can be saved directly to a USB flash drive
■ Screenshots saved to a USB flash drive
■ Contact check function
■ Synchronized signal sources
- High-speed, high-precision testing of electrolytic capacitors
- High-speed, high-precision testing of DC-Link capacitors
- High-speed and high-precision testing of ceramic capacitors
- High-speed, high-precision testing of film capacitors
- High-speed testing of various capacitor production lines
- High-speed automated production line integration testing
- Semiconductor, device, material distributed capacitance testing
- Various other capacitors ......
| standard equipment | |||||
| Accessory Name | model number | ||||
| Four ends with card fixture | TH26005C | ||||
| short circuit board | TH26010 | ||||
| Test Fixture | TH26078 | ||||
| Boxed Four-Ended Insulated Locking Kelvin Test Leads | TH26011BS | ||||
| optional | |||||
| Accessory Name | model number | ||||
| Magnetic Ring Clamp (Piece Type) | TH26007A | ||||
| Magnetic Ring Fixture | TH26008A | ||||
| Patch Test Leads with Boxes | TH26009B | ||||
| fixture (machining) | TH26047 | ||||
| Test Fixture | TH26062 | ||||
| Test Fixture | TH26063 | ||||
| High Frequency Patch Fixture | TH26108C | ||||
| Dielectric Test Fixture | TH26077 | ||||
Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.


















