TH511 Semiconductor C-V Characterization Analyzer

TH510 series semiconductor C-V characteristics analyzer is Changzhou with the Hui electronics according to the current trend of semiconductor power devices, semiconductor materials and power devices designed for the analysis of instruments.

The instrument adopts the integrated design, diode, transistor, MOS tube and IGBT semiconductor power device parasitic capacitance, CV characteristics can be tested with one key, no need to frequently switch the wiring and set parameters, single-tube power devices and module power devices can be quickly tested with one key, suitable for production line rapid testing, automation integration.

The CV curve scanning analysis capability can also satisfy the R&D and analysis of semiconductor materials and power devices in the laboratory (this function is optional).

The instrument is designed for frequencies from 1 kHz to 2 MHz, V_gsVoltage up to ±40V, V_DSVoltages up to ±200V/±1500V/±3000V are sufficient for most power device testing.

Summary parameters	TH511	TH512	TH513
conduit	2 (expandable to 6)	2 (expandable to 6)	1
Test Frequency	1kHz-2MHz
test parameter	Ciss, Coss, Crss, Rg
VGSrealm	0 - ±40V
VDSrealm	0 - ±200V	0 - ±1500V	0 - ±3000V

Functional Features

A. Integrated testing with high integration, small size and high efficiency

An instrument with built-in LCR digital bridge, V_GSVoltage Source, V_DSVoltage source, high and low voltage switching matrix and the upper computer software, the complex wiring, cumbersome operation is integrated into the Linux system supporting capacitive touch, the operation is more simple. It is especially suitable for production line rapidization and automation testing.

B. Single-tube device testing, 10.1-inch large screen, four parasitic parameters displayed on the same screen, so that the details at a glance

The four most important parasitic parameters of MOSFET or IGBT: Ciss, Coss, Crss, Rg, Cies, Coes, Cres, Rg can be tested with one key. The 10.1-inch large screen can simultaneously display important parameters such as measurement results, equivalent circuit diagrams, and sorting results at the same time.

When testing single-tube device devices with one key, there is no need to frequently switch between test legs, measurement parameters, and measurement results, which greatly improves test efficiency.

C. List test, multiple, multi-core, module device measurement parameters displayed on the same screen

TH510 series semiconductor C-V characteristics analyzer supports up to 6 single-tube devices, 6 core devices or 6 module device testing, all measurement parameters through the list scan mode at the same time to display the test results and judgment results.

D. Curve scanning function (optional)

Among the parameters of MOSFET, CV characteristic curve is also a very important index, as follows

TH510 series semiconductor C-V characteristic analyzer supports C-V characteristic curve analysis, which can realize curve scanning in two ways: logarithmic and linear, and can display multiple curves at the same time: multiple curves of the same parameter and different Vg; multiple curves of the same Vg and different parameters.

TH510 series supports multiple curve scanning models at the same time

Curve supports scatter marking and thickness adjustment

Original Ciss-Rg curve scanning

E.Cs-V function, diode junction capacitance CV characteristic test analysis

     Thanks to the built-in 2-channel DC power supply of the TH510 Series Power Device CV Characterization Analyzers, CV characterization of diodes is possible. The Cs-V function can be used to test the junction capacitance of various diodes and analyze the CV characteristics of diodes.

F. Equivalent mode conversion

TH510 series power device CV characteristics analyzer test results of capacitance C are series mode Cs, for some of the needs of the test parallel mode Cp needs of customers, you can switch.

 

G. A variety of unique technologies to solve the automation supporting test pain points    

When supporting automated equipment or production lines, the following problems are often encountered, and Tonghui has been optimized for a variety of situations.

        1) Unique technology to solve Ciss, Coss, Crss, Rg production line / automation system high-speed test accuracy

With nearly 30 years of experience in the capacitance testing industry, Tonghui can ensure the accuracy of capacitance and resistance testing in high-speed and high-precision testing occasions such as production lines and automated testing.

Conventional production line test, provide standard 0 meter test fixture, direct insertion device can be directly inserted for testing, Ciss, Coss, Crss, Rg test precision.

For automation testing, since automation equipment test fixtures usually require long connection lines, most automation equipment manufacturers will bring great precision deviation when extending the test line, for this reason, Tonghui has designed a unique 2-meter extension cable and built-in 2-meter calibration to ensure that the test accuracy of Ciss, Coss, Crss, and Rg is the same as that of the 0-meter test fixtures.

        (2) Contact check (Contact) function, in advance of the elimination of automation test hidden danger

In high-speed testing, especially automated testing, often due to rapid insertion and removal or closure, resulting in test fixtures or tooling surface wear, lead breakage and poor contact, poor contact caused by the most direct consequences of misjudgment of the test results and difficult to find in the sudden increase in the rate of rejects or issued when the reason for the return of the product failure will be found, so it is a great hidden danger.

Tonghui TH510 series semiconductor C-V characteristics analyzer uses a unique hardware test method, the use of four-terminal measurement method, each foot are connected to two wires, if any one of the wires broken or poor contact contact points can be found in a timely manner and provide a poor contact point prompts, the instrument automatically stops the test, waiting for further processing.

The accuracy of the results is guaranteed, and at the same time, it facilitates the timely detection of problems by customers and avoids the losses caused by the increase of defective products and the return of faulty products.

 

        (3) Fast on-off test (OP_SH), to rule out damage to the device

In the semiconductor device characteristics test, due to half of the device itself is damaged, especially multi-core device one of the core has been damaged, the test of stray capacitance may still be judged to be qualified, and the semiconductor device on characteristics is the most important characteristics.

Therefore, it is not necessary to test the C-V characteristics of products that have poor conduction characteristics, which not only wastes the measurement time, but also leads to the loss of finished products that are returned after shipment due to the mixing of C-V qualified products with good products.

 

The TH510 series semiconductor C-V characteristics analyzers provide a fast on-off test (OP_SH) function that can be used to directly determine the device's own conduction performance.

   

 

        (4) Crss+Plus function to solve the problem of negative Crss value under high frequency of automated test system

Crss capacitors are usually in the pF class, which is a small capacity and can be a challenge to test.

And in automated test systems, parasitic parameters brought about by too many adapter switches, too long test leads, and so on.

As a result, testing Crss, especially at high frequencies usually results in negative values that

With 30 years of accumulated technology and experience in the capacitor testing industry, Tonghui Electronics adopts Crss Plus mode with unique algorithms, which can guarantee correct results even in automated test systems and at high frequencies.

        (5) Leakage source high-voltage breakdown protection technology to prevent damage to the test instruments

In the test of power device capacitance, drain D is usually added to the high voltage, especially the third generation of power semiconductor devices, the voltage can even be as high as 1000V-3000V, when the leakage source instantaneous breakdown, often lead to instantaneous short-circuit discharge of the capacitor, in the leakage source voltage of 1500V, the discharge current can be as high as 780A, such a large instantaneous current, it will be backwash to the internal circuitry of the instrument, and lead to damage.

Tonghui high-voltage breakdown protection technology, to solve this hidden danger, to avoid frequent damage to the instrument due to high-voltage shock, reducing maintenance costs while improving the efficiency of automated testing.

        6) Interlock function to ensure safe operating environment under high voltage (TH513 only)

In testing power devices, high voltage is applied, so it is very important to isolate the operator and other equipment, especially in automated production lines, where high-voltage equipment is usually placed in an isolated environment and safety gates are opened and closed to ensure the safety of the operator.

TH510 series power device CV characteristic analyzer is equipped with Interlock interface, which can be connected with the safety door switch to cut off the high-voltage output and prohibit the instrument from starting when the safety door is open, and can work normally only after it is closed. This ensures the safety of the operator and the equipment.

        7) Modular device setup, support customization

For modular devices such as dual (Dual) MOSFETs, multi-group IGBTs, some devices will have different types of chips in a mixed package, TH510 series of CV characteristic analyzers optimized for this situation, the common modular chip Demo has been built-in, and special chips to support customization.

        8) 10-speed sorting and programmable HANDLER interface

The instrument provides 10 grades of sorting, which provides the possibility of grading the quality of the customer's products, and the sorting results are directly outputted to the HANDLER interface.

When connecting with automation equipment, how to configure the HANDLER interface output has always been a difficult problem for automation customers. TH510 series LCRs visualize the HANDLER interface pin position, input/output mode, corresponding signal, and answer mode completely, making automation connection simpler.

H:Simple and quick setting

Single test setup interface

List Scan Settings Screen

Parameters can be selected arbitrarily, can be turned on and off, turn off the parameters can effectively save time and data transmission; delay time can be set automatically or set by yourself; gate resistor can be selected as drain-source short-circuit or drain-source open-circuit.

 

CV Scan Setup Screen

Adopting graphical setting interface, the function parameters corresponding to the schematic diagram settings are clear at a glance.

I:Support customization, intelligent firmware upgrade method

Tonghui Instruments is open for customers, all interfaces and instruction sets of the instrument are open design, customers can program their own integration or customized functions, and the customized functions can be updated directly through firmware upgrade if there is no hardware change.

The instrument itself can be updated by upgrading the firmware without returning to the factory for function improvement, bug solution, function upgrade, and so on.

Firmware upgrades are very smart and can be done through the system setup interface or the file management interface, which intelligently searches for upgrade packages in the instrument's memory, external USB flash drive, or even on the LAN, and upgrades them automatically.

j: Knowledge of parasitic capacitance of semiconductor components

In high-frequency circuits, the parasitic capacitance of semiconductor devices tends to affect the dynamic characteristics of semiconductors, so the following factors need to be taken into account when designing semiconductor components:

The effects of diode junction capacitance often need to be considered in high frequency circuit design;

The parasitic capacitance of the MOS tube affects various characteristics of the tube such as action time, drive capability and switching loss;

The voltage dependence of parasitic capacitance is also critical in circuit design, using MOSFETs as an example

notation	name (of a thing)	Test Principle	affect (usually adversely)
Ciss	Input Capacitance	Drain-source shorting, capacitance between gate and source measured with AC signal, Ciss = Cgs +Cgd	Affects delay time; the larger the Ciss, the longer the delay time
Coss	Output Capacitance	The capacitance between drain and source measured with an AC signal with the gate source shorted, Coss = Cds +Cgd	The larger the Crss, the worse the drain current rise characteristic, which is detrimental to MOSFET losses. Low capacitance is required for high speed drive.
Crss	Reverse Transmission Capacitance	The capacitance between the drain and gate measured with an AC model with the source grounded, also known as the Miller capacitance The reverse transfer capacitance is equivalent to the gate drain capacitance. crss = Cgd	Affects turn-off characteristics and losses at light loads. If Coss is larger, turn-off dv/dt decreases, which favors noise. However, the loss at light load increases.
Rg	Gate Input Resistance	Rg is defined as a drain-source short, and occasionally as an open drain

K: Standard Accessories