{"id":20780,"date":"2025-03-25T12:19:21","date_gmt":"2025-03-25T04:19:21","guid":{"rendered":"https:\/\/www.wbyq.cn\/?page_id=20780"},"modified":"2025-04-15T11:40:11","modified_gmt":"2025-04-15T03:40:11","slug":"precise","status":"publish","type":"page","link":"https:\/\/ad.wbyq.cn\/en\/precise\/","title":{"rendered":"precise"},"content":{"rendered":"
<\/div><\/a><\/div>\"\"\/<\/a><\/div>
<\/div><\/a><\/div>\"\"
<\/div><\/a><\/div>
<\/div><\/a><\/div>\"\"
<\/div><\/a><\/div>
<\/div><\/a><\/div>\"\"
<\/div><\/a><\/div>
<\/div><\/a><\/div>\"\"
<\/div><\/a><\/div>
<\/div><\/a><\/div>\"\"
<\/div><\/a><\/div>
<\/div><\/a><\/div>\"\"
<\/div><\/a><\/div>
<\/div><\/a><\/div>\"\"
<\/div><\/a><\/div>
<\/div><\/a><\/div>\"\"
<\/div><\/a><\/div><\/div><\/i><\/a><\/i><\/a>
<\/div><\/div><\/section>\n\n\n\n

Hotline: Fu Manager 13717737785<\/strong><\/p>\n\n\n\n

Digital Source Meter, Semiconductor Parameter Analyzer, Power Device Static Parameter Test System, Semiconductor Power Device C-V Characterization Test System, Multiplexed High Power Laser Aging System<\/strong><\/p>\n\n\n\n

\"Desktop
<\/div><\/div>Desktop Instrumentation<\/b><\/div>
<\/span>DC source meter, pulse source meter, narrow pulse source,<\/span>High current pulse source meter, high current source,<\/span>High voltage source, high power laser test power supply<\/span><\/div><\/a>
\"Plug-in
<\/div><\/div>Plug-in Meter<\/b><\/div>
3-daughter card\/10-daughter card plug-in source meter<\/span>Data Acquisition Card, Pulse Constant Voltage Source<\/span><\/div><\/a>
\"test
<\/div><\/div>test system<\/b><\/div>
Semiconductor parameter analyzer, power device static parameter test system, current sensor test system, multiplexed high power laser aging system<\/span><\/div><\/a><\/div><\/div><\/section>\n\n\n\n
\n
\n
\n
\n
\n
\n

prescription<\/strong><\/strong><\/h2>\n\n\n\n

Solution<\/strong><\/p>\n\n\n\n

<\/div><\/div><\/div>\n<\/div>\n<\/div>\n\n\n\n
\n
\n
\"Power<\/div>
<\/div>

power semiconductor<\/span>--<\/span><\/h3>SiC (silicon carbide), GaN (gallium nitride) as the representative of the power semiconductor device parameters can be divided into two categories: static characteristic test and dynamic characteristic test. Static characteristic test is mainly characterized by the device intrinsic characteristics indicators, such as breakdown voltage, leakage, transconductance, on-resistance, etc.; dynamic parameters refers to the device switching process parameters, such as switching characteristics parameters, body diode reverse recovery characteristics parameters and gate charge characteristics parameters, etc., the main use of double-pulse test.<\/span><\/font>View Details<\/span><\/div><\/a><\/div>
\"Discrete<\/div>
<\/div>

discrete device (computing)<\/span>--<\/span><\/h3>Wuhan Purcells Instrumentation Co., Ltd. provides diode\/transistor\/FET\/high-power laser and other semiconductor discrete device electrical performance testing solutions for process design\/material evaluation\/product modeling performance verification, reliability analysis, production process control, wafer acceptance testing\/mold classification, packaging testing, failure analysis, for semiconductor discrete device research and development, production and validation to provide a One-stop solution for R&D, production and validation of semiconductor discrete devices.<\/span><\/font>View Details<\/span><\/div><\/a><\/div>
\"Materials<\/div>
<\/div>

Materials Research<\/span>--<\/span><\/h3>Wuhan Purcells Instrumentation Co., Ltd. provides solutions to characterize the electrical properties of semiconductor materials, which can test the electrical parameters of semiconductor materials, such as current 1, voltage V, or resistance Q, and provide reliable data support for the research and analysis of semiconductor materials.<\/span><\/font>View Details<\/span><\/div><\/a><\/div>
\"Sensors<\/div>
<\/div>

transducers<\/span>--<\/span><\/h3>Wuhan Purcells Instrumentation Co., Ltd. offers a \"5-in-1\" transducer performance verification test solution, with a single instrument that can be used as a stand-alone constant voltage or constant current source, voltmeter, ammeter and ohmmeter, as well as a precision electronic load. Its high-performance architecture also allows it to be used as a pulse generator, waveform generator, and automated current-voltage (I-V) characterization system that supports four-quadrant operation.<\/span><\/font>View Details<\/span><\/div><\/a><\/div>
\"Teaching<\/div>
<\/div>

Teaching integrated circuits and microelectronics<\/span>--<\/span><\/h3>Wuhan Purcells Instrumentation Co., Ltd. education and teaching laboratory integrated workbench solutions, which can cover IC testing and verification, IC principles and applications, semiconductor device physics, semiconductor integrated circuits, analog electronics technology basic experiments, basic circuit experiments and other professional courses, to help colleges and universities to create a practical training center for chip and power device testing.<\/span><\/font>View Details<\/span><\/div><\/a><\/div><\/div>
<\/div><\/div><\/section>\n<\/div>\n<\/div>\n<\/div>\n<\/div>
<\/div><\/section>\n<\/div>\n<\/div>
<\/div><\/section>\n\n\n\n
\n
\n
\n
\n

Product Recommendation<\/mark><\/h2>\n\n\n\n

Our laset product<\/p>\n<\/div>\n<\/div>\n\n\n\n

Desktop Source Meter<\/span><\/a><\/div>
Pulse Source Table<\/span><\/a><\/div>
High Voltage Source Measurement Unit<\/span><\/a><\/div>
Semiconductor parameter analyzer<\/span><\/a><\/div><\/div><\/div><\/div>\n\n\n
<\/div><\/i><\/a><\/i><\/a>
<\/div><\/div>\n\n\n

<\/p>\n<\/div>\n<\/div>

<\/div><\/section>\n\n\n\n
\n
<\/div>\n\n\n\n
<\/div>\n<\/div><\/div>\n\n\n\n