{"id":21072,"date":"2025-03-08T11:30:37","date_gmt":"2025-03-08T03:30:37","guid":{"rendered":"https:\/\/www.wbyq.cn\/product\/21072.html"},"modified":"2025-03-08T11:57:19","modified_gmt":"2025-03-08T03:57:19","slug":"sp26s%e7%b3%bb%e5%88%97%e5%8d%8a%e5%af%bc%e4%bd%93%e9%9d%99%e6%80%81%e5%8f%82%e6%95%b0%e6%b5%8b%e9%87%8f%e7%b3%bb%e7%bb%9f","status":"publish","type":"product","link":"https:\/\/ad.wbyq.cn\/en\/product\/21072.html","title":{"rendered":"SP26S Series Semiconductor Static Parameter Measurement System"},"content":{"rendered":"<p>System components.<\/p>\n<p>Xinrui Zhongke power device static parameter test system, mainly including test host, test line, test fixture, computer, host computer software, as well as related test accessories and other components. The whole system adopts<\/p>\n<p>The test equipment developed in-house by New Roc-Master has built-in voltage, current and capacitance measurement modules of various specifications. Combined with the proprietary host computer test software, the test unit can be configured with different settings according to the needs of the test project.<\/p>\n<p>The test data can be saved and exported, and I-V and C-V curves can be created. Test data can be saved and exported, and I-V and C-V curves can be created. In addition, the Tester can be used in conjunction with a Probe Station.<\/p>\n<p>For wafer-level chip testing, the FTD is a new technology that can be used to test the chips at the wafer level.<\/p>","protected":false},"excerpt":{"rendered":"<p>System Overview.<\/p>\n<p>New Rui Zhongke Power Device Static Parameter Test System integrates various measurement functions and can accurately measure power devices of different package types (e.g. MOSFETs, BJTs, IGBTs, as well as SiC and GaN third-generation semiconductors, etc.).<br \/>\nIt features high-voltage and high-current characteristics, accurate measurement of \u03bc\u03a9-level on-resistance, and the power to measure nA-level leakage current. Supports junction capacitance testing of power devices in high voltage mode, such as input capacitance and output capacitance,<br \/>\nReverse transmission capacitance, etc.<\/p>","protected":false},"featured_media":21068,"comment_status":"open","ping_status":"closed","template":"","meta":{"themepark_post_bcolor":"#f5f5f5","themepark_post_width":"1022px","themepark_post_img":"","themepark_post_img_po":"left","themepark_post_img_re":false,"themepark_post_img_cover":false,"themepark_post_img_fixed":false,"themepark_post_hide_title":false,"themepark_post_main_b":"","themepark_post_main_p":100,"themepark_paddingblock":false},"product_brand":[4302],"product_cat":[4304],"product_tag":[],"class_list":{"0":"post-21072","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_brand-newsemitest","7":"product_cat-power-semiconductors","9":"first","10":"instock","11":"shipping-taxable","12":"purchasable","13":"product-type-variable","14":"has-default-attributes"},"_links":{"self":[{"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/product\/21072","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/comments?post=21072"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/media\/21068"}],"wp:attachment":[{"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/media?parent=21072"}],"wp:term":[{"taxonomy":"product_brand","embeddable":true,"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/product_brand?post=21072"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/product_cat?post=21072"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/ad.wbyq.cn\/en\/wp-json\/wp\/v2\/product_tag?post=21072"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}