{"id":22715,"date":"2025-04-18T14:03:29","date_gmt":"2025-04-18T06:03:29","guid":{"rendered":"https:\/\/www.wbyq.cn\/product\/22715.html"},"modified":"2025-05-17T17:41:45","modified_gmt":"2025-05-17T09:41:45","slug":"%e6%ba%90%e6%b5%8b%e9%87%8f%e5%8d%95%e5%85%83-smm3000x%e7%b3%bb%e5%88%97","status":"publish","type":"product","link":"https:\/\/ad.wbyq.cn\/en\/product\/22715.html","title":{"rendered":"Source Measurement Units SMM3000X Series"},"content":{"rendered":"
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Highly accurate pulse simulation<\/h2>\n<\/div>\n<\/div>\n
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In pulse mode, the SMM3000X series supports \u00b110.5A pulse current output with a minimum pulse width of 50\u03bcs, which can accurately simulate the transient conditions of power devices, such as switching loss testing of GaN (Gallium Nitride) and SiC (Silicon Carbide) devices, providing strong support for the R&D and testing of power semiconductor devices.<\/p>\n

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Linear\/Logarithmic Scan<\/h2>\n<\/div>\n<\/div>\n
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The SMM3000X series supports linear\/logarithmic scanning, which can output voltage or current point by point with fixed step values according to the user's preset start point to end point, and at the same time automatically measure and record the value of each point. Users can quickly verify the characteristics of diodes, transistors and other semiconductor devices at different operating points, obtain their conduction characteristic curves, and analyze and optimize the performance of the devices.<\/p>\n

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Flexible customization of sequences<\/h2>\n<\/div>\n<\/div>\n
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The list mode supports user-defined output sequences with minimum intervals of up to 10\u03bcs, and parameter variations can be linear or non-linear, or even arbitrary values or customized sequences.The SMM3000X outputs voltage or current in sequence according to the values set in the list, and measures and records the data at the same time, which makes it suitable for irregular voltage\/current variation tests or multi-segment tests, etc.<\/p>\n

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Data visualization and analysis<\/h2>\n<\/div>\n<\/div>\n
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The SMM3000X series provides a variety of view modes such as Graph view, Roll view and Measurement result view. Users can plot real-time curves of math operation results through Graph view, display time domain waveforms of test data through Roll view, and obtain statistical views of trace statistics results through Measurement Results view. Multiple view modes provide multi-dimensional parameter analysis, so users can understand and analyze the test data more intuitively.<\/p>\n

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Highly efficient programmable<\/h2>\n<\/div>\n<\/div>\n
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SMM3000X series is based on the advanced SCPI command set and supports communication with computer via USB and LAN interface to realize efficient and convenient remote control. Users can easily control it via Web Server or customize it with SCPI commands to meet diversified testing needs. In addition, users can also utilize socket communication technology to interact with the SMM3000X via TCP\/IP protocol to easily realize remote testing and control.<\/p>\n

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The SMM3000X series are precision source\/measurement unit (SMU) instruments that simultaneously output and measure voltage and current, with integrated current source, voltage source, voltmeter, and ammeter functions, and are especially suited for semiconductor characterization, nanoscale devices and materials, organic semiconductors, and other test applications.<\/p>\n<\/div>\n<\/div>\n

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