S系列高精度数字源表是普赛斯历时多年打造的高精度、大动态范围、数字触摸的率先国产化源表,集电压、电流的输入输出及测量等多种功能。
最大输出电压300V,最小电流分辨率10pA,支持四象限工作,因此广泛应用于各种电气特性测试:半导体IC或元器件、功率器件、传感器、有机材料与纳米材料等特性测试和分析。
model number | Maximum voltage source/range | Maximum current source/range | maximum power | accurate | communications interface |
---|---|---|---|---|---|
S100 | 30V | 1A | 30W | 0.1% | RS-232/GPIB/LAN |
S200 | 100V | 1A | 30W | 0.1% | RS-232/GPIB/LAN |
S300 | 300V | 1A | 30W | 0.1% | RS-232/GPIB/LAN |
*The above specifications are subject to update without prior notice.
● 5寸触摸显示屏,全图形化操作
● 高至300V低至10pA,最大测试功率30w
● 支持前后面板、2/4线以及GUARD保护
● 多种通讯方式:RS-232、GPIB、以太网
● 全量程输出及测量精度可达0.1%
● 标准的SCPI指令集,便于客户二次开发
● 易搭建半导体电性能测试方案
● 可用于测试半导体的电性能指标:I、V、R
Why S-Series Digital SourceMeter?
- powerful-作为电压源和或电流源,并同步测量电流和或电压,支持四象限工作。可以限定电压或电流输出大小,预防器件损坏。
- all sorts of flexibility-Support two-wire and four-wire measurement, more accurate measurement of low internal resistance; integrated linear step scan, logarithmic step scan, custom scan mode; professional l-V characteristics and semiconductor parameter test software.
- easy learn and practical-Simplifies measurement preparation for a variety of applications such as I-V and l-t/V-t curves. Capacitive touch-screen graphical user interface (GUI), providing two modes of displaying measurement results, graphical and digital, for ease of use and viewing.
All-in-one high-precision SMU for ultimate simplicity of measurement
Traditional semiconductor I-V characterization solutions are often complex and costly, requiring multiple instruments to be used in conjunction with each other to complete the test. Programming, synchronizing, connecting, measuring, and analyzing the different instruments is complex, time-consuming, and takes up a lot of test bench space.
The S-Series digital source meters can be used as stand-alone constant voltage or constant current sources, voltmeters, ammeters, and ohmmeters, as precision electronic loads, and their high-performance architecture allows them to be used as waveform generators, as well as automated current-voltage (I-V) characterization systems. This dramatically reduces the time required to develop, build, and maintain a test system, while saving valuable "space" in the test rack or test bench and reducing the overall cost of purchasing a test system.
Four-quadrant operation, either as source or load
The power supply quadrant is the quadrant map formed with the power supply output voltage as the X-axis and output current as the Y-axis. The first and third quadrants, i.e., the voltage and current are in the same direction, and the source meter supplies power to other devices, which is called the source mode; the second and fourth quadrants, i.e., the voltage and current are reversed, and other devices discharge power to the source meter, and the source meter passively absorbs the incoming current and can provide a return path for the current, which is called the trap mode.
Unlike traditional matrix power supplies, S series source meters can be selected by customers to have either high voltage and low current or low voltage and high current outputs under the same power level according to their actual needs. Different ranges are selected, and the source/trap limits of S series source meters are also different.
Source Limits - Voltage Sources.
10V (≤3A range), 30V (≤1A range), 300V (≤100mA range)
Source Limits - Current Sources.
Earth 3.15A (≤10V range), Earth 1.05A (≤30V range), Std 105mA (≤300V range)
Easily meets common measurement needs
Touch any icon on the screen to bring up the graphical setup screen. Follow the wizard to set up one by one before measurement for more intuitive operation.
Applications offered
- Sequence scanning
- Custom Sequences
- Data Logger: Continuous Output Constant Voltage Source Test Mode; Continuous Output Constant Current Source Test Mode
- APD tube
- Transistors: MOSFET tube test; Triode test
- LIV: PIN Tube Scan Test
- Gummer: dual source tables scanned with the same parameters
*Diode complete l-V characteristic curve