TH2829NX Automatic Transformer Test System
| Product Model | TH2829LX | TH2829AX | TH2829AX-24 | TH2829AX-48 | TH2829NX | TH2829BX | TH2829CX | ||||||
| Test Pin Location (PIN) | 20 | 20 | 24 | 48 | 72/96/120/144/168/192 | 20 | 20 | ||||||
| Test Frequency | 20Hz-200kHz | 20Hz-500kHz | 20Hz-1MHz | ||||||||||
| demonstrate | 7-inch TFT LCD monitor 800 x RGB x 600 | ||||||||||||
| LCR function | You can contact the salesman to purchase a permanent opening | ||||||||||||
| Transformer test parameters | turnover ratio | number of laps | phase (waves) | inductors | capacitors | leakage | quality factor | alternating current (AC) resistance | DC resistance | equilibrium | pin short | diode forward and reverse | |
| Turn Ratio | Turns | Phase | L | C | Lk | Q | ACR | DCR | Balance | Pin Short | Diode P/N | ||
| LCR Test Parameters | |Z|, |Y|,C,L,X,B,R,G,D,Q,θ,DCR,Turn-Ratio,Phase,Lk | ||||||||||||
| Basic Measurement Accuracy | LCRZ | 0.05% | |||||||||||
| DCR, Turn Ratio | 0.1% | ||||||||||||
| Signal source output impedance | 10Ω, 30Ω, 50Ω, 100Ω | ||||||||||||
| Test speed (ms/test) | 13ms,90ms,370ms | ||||||||||||
| AC Signal Level | 5mVrms- 2Vrms (transformer test, customizable to 10Vrms), 5mVrms- 10Vrms (LCR function); 50μArms- 100mArms | ||||||||||||
| DC bias voltage source | ------ | 0V- ±10V; 0mA- ±100mA | |||||||||||
| DC bias current source | 0 - ±1A option (option TH2901), 0 - ±2A (option TH2902) | ||||||||||||
| DC constant current source | 0mA- ±120mA for forward diode characterization | ||||||||||||
| Diode Testing | Forward Test Voltage | 0-9.9999V | |||||||||||
| Reverse test current | 0-99.999mA | ||||||||||||
| comparator | 10-speed sorting, PASS/FAIL indication and counting function. | ||||||||||||
| stockpile | Internal: 100 sets of setup files saved; USB flash drive: 500 sets of setup files, CSV format test data, GIF format images | ||||||||||||
■ 测试脚位:72/96/120/144/168/192 PIN
■ 测试频率:20Hz-200kHz, 分辨率:0.5mHz
■ Signal level: 5mV-2Vrms (2mV-10Vrms optional)
■ Test speed: as fast as 13ms
■ Diode forward/reverse characterization
■ Improved high turn ratio and weakly coupled transformer testing capabilities
▪ Improved DCR testing capabilities
■ Single screen for all scanning test results
■ Time-stamping system: memorization of file settings, calibration deviations and deduction of time
■ Multi-sorting with selected scanning parameters
■ Scanning fixture relay self-test function
▪ Flexible deviation deductions
■ Multiple options for handling defects
■ Single-parameter test cycles for test judgment of individual windings
▪ Increased security: two levels of passwords for administrators and operators
■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.
■ Barcode reading directly recalls setup files to manage test product varieties
■ Optional PC-level instrument test setup file programming capability
■ Online upgrade mode: USBHOST or RS232
■ Supports multi-instrument networking via LAN interface.
■ Backward compatible with TH2818X/TH2819X parameter setup files
■ Storage: Internal: 100 sets of setting files saved
■ 开关变压器扫描测试、综合特性分析。
■ Network transformer scanning tests, comprehensive characterization
■ Multi-scan testing of discrete passive components (inductors L, resistors R, capacitors C)
■ Multi-scan testing of relay driver packages, contact contact resistance
■ Multiple DC resistance DCR scan test
■ Comprehensive test analysis of multiple passive components in impedance networks
| standard equipment | |||||
| Accessory Name | model number | ||||
| Test Leads at Both Ends | TH26004B | ||||
| Foot-activated switch | TH2829AX-001 | ||||
| Boxed Four-Ended Insulated Locking Kelvin Test Leads | TH26011AS | ||||
Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.

















