Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
:: Optimization of probe movement reduces detection time by 20%
:: Incorporation of the latest test probes to minimize test needle marks
:: Detection of potential defects through statistical processing software
:: Substrate setting: vertical orientation
:: Arm structure: front 2 and back 2 (4 arms)
● Maximum measurable substrate size: 610 x 510 mm
■ Outline of specifications
| armchair number | 4 (2 on front, 2 on back) |
|---|---|
| Probe mountable | 1172 Series, CP1072 Series |
| Testable Substrate Size | Standard specifications: 50W × 50H to 610W × 510H mm, thickness 1.0 to 3.2 mm Pneumatic Substrate Clamp (option): 50W × 70H to 610W × 510H mm, thickness 0.6 to 6.0 mm |
| Maximum measurable area | 604W × 504H mm |
| Comprehensive Positioning Accuracy | □25μm (Note: Limited by inspection conditions) |
| Minimum distance between measurement points | 50 μm (L-R arm spacing when using probe CP1072-01) |
| Measurement range | DC constant current on-state measurement: 400.0 μΩ ~ 400.0 kΩ DC constant current resistance measurement: 40.00 μΩ ~ 400.0 kΩ DC constant voltage resistance measurement: 4.000 Ω ~ 40.00 MΩ Insulation resistance measurement: 1.000 kΩ ~ 100.0 GΩ AC constant voltage capacitance measurement: 100.0 fF ~ 10.00 μF Leakage current measurement: 1.000 μA ~ 10.00 mA High voltage resistance measurement: 1.000 kΩ ~ 100.0 GΩ Capacitance insulation measurement: 1.000 kΩ ~ 10.00 MΩ Open circuit measurement: 4.000 Ω ~ 4.000 MΩ Short circuit measurement: 400.0 mΩ ~ 40.00 kΩ |
| Scope of determination | -99.9% ~ +999.9%, or absolute value |
| measuring time | Max. 0.015 sec/step (0.15mm movement, 4-arm simultaneous contact, pad capacitance test) |
| power supply | AC200 V, 220 V, 230 V, 240 V single-phase (specify when ordering) 50/60 Hz, 3 kVA |
| Volume and weight | 1500W × 1950H × 800D mm, 1000 kg |
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