Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
■ TH2839 series adopts automatic balanced bridge technology with wide impedance measurement range. Its basic accuracy of 0.05% and frequency range of 20Hz-10MHz can meet the measurement requirements of components and materials, and it is a powerful tool for the design, inspection, quality control and production testing of electronic components. Its excellent performance and functions provide a powerful tool for circuit design and development as well as material (electronic and non-electronic materials) research and development.TH2839 with its excellent performance can realize a variety of tests for commercial standards and military standards such as IEC and MIL standards.
▪ Short video presentation:https://v.youku.com/v_show/id_XNDYxNDYyMzU2OA==.html
Functional Features
- highly accurate
The auto-balanced bridge ensures higher frequency accuracy over a wider frequency range than ordinary LCR bridges! The following figure compares the accuracy difference between auto-balanced bridges and ordinary bridges in the frequency range of 0-10MHz, using Tonghui bridges as an example. Currently, Tonghui's auto-balanced bridges include TH2839 series, TH2838 series and TH2828 series.
- High stability and consistency
- high speed
- Functions and Interfaces
- Material Dielectric Constant Testing
TH2839 series with the special material test fixture TH26077 and the host computer software can easily and accurately measure the dielectric constant of materials at different frequencies.
- Optional accessories
- host computer software
- a) Generic host computer software
Test approach:
File Save:
Hardware connection: RS232C, USB, GPIB, LAN
Data image saving format: TXT, XLS, MDB, CSV, BMP, JPG, PNG
Other functions: automatic recording, setting file saving, user management, etc.
- b) Piezoelectric ceramics host computer software
Analyze the settings:
Analyze the results:
- c) Impedance analysis software (equivalent circuit analysis software)
Different types of devices in real life can be equated into simple circuit models consisting of 3-4 devices. The Impedance Analyzer host computer provides 7 basic circuit models for the equivalence of these devices. The software also provides an auto-matching function, i.e., if the device under test is a black box, the software automatically matches the model that best matches it and calculates the parameters. You can compare the impedance fitting curves of the simulated equivalent circuit parameter values with the actual measured impedance curves, and you can also fit the model of your choice according to the parameters you input. The equivalent circuit model can be directly exported to a TXT file for users to save and use.
| Product Model | TH2839 | TH2839A | |
| Test Signal Source | |||
| Signal source output impedance | 100Ω, ±1% @1kHz | ||
| Test Frequency | realm | 20Hz-10MHz  20Hz-5MHz |
|
| resolution (of a photo) | 20.0000Hz - 99.9999Hz 1mHz | ||
| 100.000Hz - 999.999Hz 10mHz | |||
| 1.00000kHz - 9.99999kHz 100mHz | |||
| 10.0000kHz - 99.9999kHz 1Hz | |||
| 100.000kHz - 999.999kHz 10Hz | |||
| 1.00000MHz - 10.00000MHz 100Hz | |||
| AC Test Signal Mode | Rated value (ALC OFF): set voltage is Hcur voltage when test terminal is open circuit
Setting the current as a constant value of current flow from Hcur when the test terminal is short-circuited (ALC ON): Keep the voltage on the DUT the same as the set value. Keep the current on the DUT the same as the set value |
||
| AC signal | voltage range | F≤ 1MHz 5mVrms- 2Vrms
F >1MHz 5mVrms - 1Vrms |
|
| resolution (of a photo) | 5mVrms - 0.2Vrms 100μVrms | ||
| 0.2Vrms - 0.5Vrms 200μVrms | |||
| 0.5Vrms - 1Vrms 500μVrms | |||
| 1Vrms - 2Vrms 1mVrms | |||
| current range | 50μArms - 20mArms | ||
| resolution (of a photo) | 50 μArms - 2mArms 1 μArms | ||
| 2mArms - 5mArms 2 μArms | |||
| 5mArms - 10mArms 5 μArms | |||
| 10mArms - 20mArms 10μArms | |||
| Rdc Testing | voltage range | 100mV - 2V | |
| resolution (of a photo) | 100μV | ||
| current range | 0mA - 20mA | ||
| resolution (of a photo) | 1μA | ||
| DC Bias | voltage range | 0V - ± 40V | |
| resolution (of a photo) | 0V - 5V 100μV | ||
| 5V - 10V 1mV | |||
| 10V - 20V 2mV | |||
| 20V - 40V 5mV | |||
| current range | 0mA - ± 100mA | ||
| resolution (of a photo) | 0 A - 50mA 1μA | ||
| 50mA - 100mA 10μA | |||
| voltage source | voltage range | -10V - 10V | |
| resolution (of a photo) | 1mV | ||
| current range | -45mA - +45mA | ||
| Output Impedance | 100Ω | ||
| monitor (computer) | |||
| Size/Type | 7-inch (diagonal) TFT LCD monitor | ||
| proportions | 16:9 | ||
| resolution (of a photo) | 800×RGB×480 | ||
| measurement function | ||||||||
| test parameter | Cp-D,Cp-Q,Cp-G,Cp-Rp
Cs-D,Cs-Q,Cs-Rs Lp-D, Lp-Q, Lp-G, Lp-Rp, Lp-Rdc Ls-D, Ls-Q, Ls-Rs, Ls-Rdc, Rdc R-X, Z-θd, Z-θr G-B, Y-θd, Y-θr Vdc-Idc |
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| math function | A(X+B)+C, X is the test parameter, A, B, C are the input parameters | |||||||
| equivalent circuit | Series, parallel | |||||||
| bias measurement | Absolute deviation from nominal value Δ, percentage deviation from nominal value Δ% | |||||||
| calibration function | Open OPEN, Short SHORT, Load LOAD | |||||||
| Range Selection | Auto AUTO, Manual HOLD | |||||||
| range (of scales or measuring equipment) | LCR | 100mΩ, 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ, 15 steps in total. | ||||||
| Rdc | 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ, total 15 steps | |||||||
| Trigger Mode | INT, MAN, EXT, BUS | |||||||
| Trigger delay | 0 s - 999 s with 100 μs resolution | |||||||
| Test Side Configuration | four-pronged attack (e.g. marriage) | |||||||
| Test cable length | 0m, 1m, 2m | |||||||
| Measured average | 1-255 times | |||||||
| measuring time
(ms) |
Speed Mode | 20Hz | 100Hz | 1kHz | 10kHz | 100kHz | 1MHz | 10MHz |
| FAST | 330 | 100 | 20 | 7.7 | 5.7 | 5.6 | 5.6 | |
| MED | 380 | 180 | 110 | 92 | 89 | 88 | 88 | |
| LONG | 480 | 300 | 240 | 230 | 220 | 220 | 220 | |
| Measurement display range a 1 x 10-18E 1 x 1018 | ||||||||
| Cs, Cp | ±1.00000 aF - 999.999 EF | |||||||
| Ls,Lp | ±1.00000 aH - 999.999 EH | |||||||
| D | ±0.00001 - 9.99999 | |||||||
| Q | ±0.01 - 9999.99 | |||||||
| R, Rs, Rp, X, Z, Rdc | ±1.00000 aΩ - 999.999 EΩ | |||||||
| G,B,Y | ±1. 00000 aS - 999.999 ES | |||||||
| Vdc | ±1.00000 aV - 999.999 EV | |||||||
| Idc | ±1.00000 aA - 999.999 EA | |||||||
| θ r | ±1.00000 rad - 3.14159 rad | |||||||
| θ d | ±0.0001 deg - 180.000 deg | |||||||
| Δ% | ±0.0001% - 999.999% | |||||||
| Basic Measurement Accuracy | 0.05% (see instructions for details) | |||||||
| List Scanning | ||||||||
| Scanning Points | Up to 201 points | |||||||
| Multi-parameter scanning | Each scanning point can be arbitrarily set function (main and sub parameters), frequency, AC level, DC bias (voltage or current), speed and other conventional test parameters; each scanning point supports open circuit, short circuit and load calibration; scanning result list can be arbitrarily selected to display the required parameters. | |||||||
| Trigger Mode | Sequential SEQ | When triggered once, measurements are taken at all scan points. /EOM/INDEX is output only once. | ||||||
| Step STEP | Performs one scan point measurement per trigger. Each point outputs /EOM/INDEX, but the list scan comparator result is only output at the last /EOM. | |||||||
| List Scan Comparator | A pair of lower and upper limits can be set for each scan point.
Both primary and secondary parameters have upper and lower limits for combined binning, and no binning is set. |
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| List scanning time stamp | In sequential mode, when the trigger point is set to 0, the time at which measurement starts can be recorded at each measurement point by defining the time. | |||||||
| Graphic Scan Analysis | ||||||||
| Scanning Points | Points 51, 101, 201, 401, 801 are optional | |||||||
| scanning track | Primary/sub-parameters selectable | |||||||
| Display range | Automatic, Locked | |||||||
| coordinate scale | Logarithmic, linear | |||||||
| scanning parameter | Frequency, ACV, ACI, DCV BIAS/DCI BIAS, DC Voltage Source | |||||||
| Scan result display | Maximum/minimum value of main/sub-parameter, setpoint main/sub-parameter value | |||||||
| Scanning Graphics Storage | Scanning graphics can be stored in the instrument's internal FLASH, external USB memory or uploaded to a host computer. | |||||||
| comparator | ||||||||
| Bin Staging | main parameter | 9 BIN, OUT_OF_BINS, AUX_BIN and LOW_C_REJECT | ||||||
| parameterization | HIGH, IN, LOW | |||||||
| Bin Limit Setting | Absolute value, deviation value, percent deviation value | |||||||
| Bin Count | 0 - 999999 | |||||||
| PASS/FAIL indication | If the main parameter is one of the 9 BINs and the sub parameter is IN, the front panel PASS lamp is ON, otherwise FAIL ON. | |||||||
| Measurement Auxiliary Functions | ||||||||
| Data buffer storage function | 201 measurements can be read in batches | |||||||
| Save/Recall Functions | 40 sets of test setup files with built-in non-volatile memory of the instrument
500 sets of instrument USB memory test setup files/screenshot graphics/log files |
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| Keyboard lock function | Lockable front panel keys | |||||||
| connector | ||||||||
| USB HOST port | Universal Serial Bus socket, Class A; FAT16/FAT32 format. USB flash drive storage or barcode scanning | |||||||
| USB DEVICE port | Universal Serial Bus socket, small Class B (4 contact positions); USBTMC-USB488 and USB 2.0 compliant, female connector for connection to external controllers. | |||||||
| LAN | 10/100BaseT Ethernet, 8-pin, two speed options | |||||||
| HANDLER interface | For Bin Staging Signal Output | |||||||
| External DC BIAS control | Controls TH1778/TH1778S bias current sources, up to one TH1778 + five TH1778S (120A MAX) | |||||||
| RS232C | Standard 9-pin, Crossed | |||||||
| GPIB (option) | 24-pin D-Sub port (Class D-24), female connector compatible with IEEE488.1, 2 and SCPI. | |||||||
| SCANNER (option) | Compatible with TH2819X, TH2829X SCANNER Interface | |||||||
■ Measurement frequency: 20Hz-5MHz, resolution: up to 1mHz
■ Measurement accuracy: 0.05%
■ Test speed: as fast as 7.7ms/time
■ Measuring principle: automatic balanced bridge
■ High stability and consistency: up to 15 test range configurations
■ High resolution: 7 inches, 800 x 480 resolution
■ Multi-function parameter list scanning
■ Multi-parameter graphical scanning function
■ Automatic polarity function for varactor diodes
■ Simultaneous Ls-RDC testing
■ 10-speed sorting function, sorting results sound and light alarms
■ Storage space: Built-in: 40 sets of setup files USB extension: 500 sets of setup files
Data log files, image files
■ High compatibility: Supports SCPI instruction set compatible with KEYSIGHT E4980A,
E4980AL, HP4284A, etc.
■ Passive Components.
Evaluation of impedance parameters and performance analysis of capacitors, inductors, cores, resistors, piezoelectric devices, transformers, chip assemblies, and network components, etc.
■ Semiconductors.
Test and analysis of parasitic parameters of LED driver integrated circuits; C-VDC characteristics of varactor diodes; analysis of parasitic parameters of transistors or integrated circuits
■ Other components.
Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.
■ Media Material.
Evaluation of dielectric constants and loss angles of plastics, ceramics and other materials
■ Magnetic material.
Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials
■ Semiconductor materials.
Dielectric constant, conductivity and C-V properties of semiconductor materialsLiquid crystal materials: C-V properties of liquid crystal units such as dielectric constant and elasticity constant
| standard equipment | |||||
| Accessory Name | model number | ||||
| short circuit board | TH26010 | ||||
| Four ends with card fixture | TH26005C | ||||
| fixture (machining) | TH26047 | ||||
| Boxed Four-Ended Insulated Locking Kelvin Test Leads | TH26011BS | ||||
| optional | |||||
| Accessory Name | model number | ||||
| Magnetic Ring Fixture | TH26008A | ||||
| Patch Test Leads with Boxes | TH26009B | ||||
| Dielectric Test Fixture | TH26077 | ||||
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