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Long-wave uncooled infrared
Electric xyz
Various objective lenses with different magnifications
Electrical Failure Analysis Software
≤0.8mK thermal sensitivity
≤5μW hot spot detection capability
≥100,000 hours of ultra-long standby time
3000V High Voltage Solutions, Heated Tables
Semiconductor/Electronic Device/PCB Failure Analysis
Short circuit between metals
Leakage and breakdown
Device resistance abnormality
Temperature distribution on the device
Phase-locked infrared microimaging system Luxet Thermo 50Product consultation and purchase：18218718851
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