Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
2601B, 2602B, 2604B Systems Sourcemeter SMU Instruments
The 2601B, 2602B, and 2604B System Sourcemeter SMU instruments are 40W DC / 200W pulse SMUs that support 10A pulses, 3A to 100fA, and 40V to 100nV DC. They combine the functions of a precision power supply, a real-world current source, a 6 ½-bit digital multimeter, an arbitrary waveform generator, a pulse generator, and an electronic load all in one tightly integrated instrument. - They combine the functions of a precision power supply, a 6½-bit digital multimeter, an arbitrary waveform generator, a pulse generator, and an electronic load, all in a single, tightly integrated instrument.
specificities
- 0.015% Basic measurement accuracy with 6½ bit resolution
- 2604B Pricing does not include TSP-Link, digital I/O, and contact checking.
- Rear panel Phoenix connectors for fast signal connections
- Used in conjunction with KickStart software
2611B, 2612B, 2614B Systems Sourcemeter SMU Instruments
The 2611B, 2612B, and 2634B System Sourcemeter SMU instruments are 30W DC/200W pulsed SMUs supporting 10A pulses, 1.5A to 100fA, and 200V to 100nV DC. All 2600B SMUs are equipped with Keithley's TSP Script Processing and TSP-Link Extension technologies. 2611B is a single-channel model, where 2612B and 2614B are dual-channel models. The 2611B is a single-channel model, while the 2612B and 2614B are dual-channel models.
specificities
- 0.015% Basic measurement accuracy with 6½ bit resolution
- 2614B Priced without TSP-Link, digital I/O, and contact checking
- Rear panel Phoenix connectors for fast signal connections
- USB 2.0, L XI-C, GPIB, RS-232
2634B, 2635B, 2636B Systems Sourcemeter SMU Instruments
The 2634B, 2635B, and 2636B System Sourcemeter SMU instruments are 30W DC / 200W Pulse SMUs that support 10 A pulses, 1.5 A down to 0.1 fA, and 200 V to 100 nV DC, and are perfect for testing very sensitive, low-current semiconductor devices, etc. The 2635B is a single-channel model, where the 2634B and 2636B are dual-channel models. The 2635B is a single-channel model, while the 2634B and 2636B are dual-channel models.
specificities
- 0.015% Basic measurement accuracy with 6½ bit resolution
- 2634B List Price without TSP-Link, Digital I/O and Contact Check, 1fA Measurement Resolution
- Rear panel triaxial connector for very low current measurements
- Inputs up to 20,000 readings per second into memory
2600B-PM-1 200V Protection Module
The Model 2600B-PM-1 200 V Protection Module with 1 A Current Clamp is a stand-alone module that protects Models 2635B and 2636B from transient overcurrent conditions. It is suitable for applications where there is an equipment fault or other potential fault that may be associated with the 1000 V power supply or the high voltage output of the SMU instrument.
specificities
- For Models 2635B and 2636B
- Maximum DC current is 100 mA
- Current clamp prevents transient current spikes of < 100 μs up to 1 A
| model number | conduit | Maximum Current Source/range (of scales or measuring equipment) | Maximum Voltage Source/range (of scales or measuring equipment) | Measurement resolution (current)/(Voltage) | power supply | quote |
|---|---|---|---|---|---|---|
| 2601B | 1 | 10A | 40V | 100fA / 100nV | 200 W | US $11,200 |
| 2611B | 1 | 10A | 200V | 100fA / 100nV | 200 W | US $11,500 |
| 2604B | 2 | 10A | 40V | 100fA / 100nV | 200 W | US $15,100 |
| 2614B | 2 | 10A | 200V | 100fA / 100nV | 200 W | US $16,500 |
| 2602B | 2 | 10A | 40V | 100fA / 100nV | 200 W | US $17,000 |
| 2612B | 2 | 10A | 200V | 100fA / 100nV | 200 W | US $17,300 |
| 2635B | 1 | 10A | 200V | 0.1fA / 100nV | 200 W | US $19,400 |
| 2634B | 2 | 10A | 200V | 1fA / 100nV | 200 W | US $25,300 |
| 2636B | 2 | 10A | 200V | 0.1fA / 100nV | 200 W | US $28,600 |
3D sensing and imaging calibration
There is a growing need for distance and velocity measurements in 3D space in applications as diverse as autonomous driving in the automotive industry, augmented reality in gaming and consumer products, and human-machine interfaces and robotics for industrial applications. The SMU is deployed to test Vertical Cavity Surface Emitting Lasers (VCSELs), which are widely used to acquire depth information in 3D applications.
2626 High Throughput DC Production Testing of Laser Diode Modules and VCSELs with Model 2602B System SourceMeter Instrumentation
Enhancing Trigger Synchronization for High Volume Production Testing of VCSELs with the 2600B Series System SourceMeter® Instruments
specificities
- Programmable current sources up to 10 A and 100 µs
- Voltage and current measurement resolution of 100 nV and 0.1 fA
- Built-in TSP processing reduces PC instrument bus communications
LED Simplified I/V Accreditation
The 2600B Series SMU is an industry-leading instrument for LED DC qualification and production testing. It can be configured to combine source current or voltage with 0.02% accuracy voltage and current measurements to meet a variety of test needs. In addition, its Test Script Processor (TSP®) technology provides throughput benefits.
LED Simplified I/V Accreditation
High Speed Testing of High Brightness LEDs
Affordable and accurate LED production testing
specificities
- Programmable current sources up to 10 A and 100 µs
- Voltage and current measurement resolution of 100 nV and 0.1 fA
- Built-in TSP processing reduces PC instrument bus communications
IDDQ Test and Standby Current Test
Keithley's 2634B/35B/36B modules are designed to meet the throughput requirements of production environments by utilizing the industry's superior low current sensitivity. Ideal for CMOS integrated circuit and electronics manufacturers to measure quiescent (standby) current, also known as leakage or IDDQ, to check for shorted oxidized gates and other defects that can lead to failures over extended periods of use.
IDDQ Test and Standby Current Test
specificities
- 0.1 fA resolution
- Stabilization time is 7 times faster than competitive products
Highly synchronized multi-pin parallel test equipment testing
The Keithley 2600B Series System SourceMeter® SMU instrument combines the scalability and flexibility of a stacked rack instrument with the integration and high throughput of a host-based system, using TSP and TSP-link technology to reduce manufacturing activities and test costs.
Creating Scalable, Multi-Pin, Multi-Function IC Test Systems
specificities
- Built-in TSP processing reduces PC instrument bus communications
- TSP-Link up to 32 instruments can be synchronized with other Keithley TSP instruments within 500 ns
Power Management Device Testing
A DC-DC converter is a widely used electronic component that converts a DC power supply from one voltage level to another while regulating the output voltage. The output provides a constant voltage to the circuit regardless of changes in input voltage or load current. The dual-channel 2600B SMU and oscilloscope are used to test power management devices.
Simplify DC-DC Converter Calibration
specificities
- Dual-channel SMU for testing input/output power
- AC testing includes measurement of start-up time, ripple, spectrum analysis and transient response.
Recommended
