Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
Increase density by a factor of 3
When production test rack space increases and you need to minimize the need to add new test racks, the 2606B can add more channel capacity in the same rack area than traditional 2U form factor SMUs.
- Easy to stack and place
- No need to add 1U of insulation spacing
- 3X more channels in the same rack space
- Same number of channels but 3 times less space+
Functions as two 2602B's
Experience the superior measurement integrity, synchronization, speed, and accuracy of the SourceMeter, equivalent to the industry's superior Keithley 2602B system, in a 1 U form factor. 2606B also uses the same analog, digital I/O, and TSP Link connectors as the 2602B for seamless migration.
- 0.015% Basic measurement accuracy
- 6 1/2 bit resolution
- 100nA low current range with 2pA sensitivity
- 8-pin Phoenix analog and 25-pin digital I/O connectors
System performance delivers unmatched production throughput
Test Script Processor (TSP®) technology provides superior performance by embedding and executing complete test programs within the SMU instrument, and TSP-Link® technology supports the expansion of up to 64 channels to support high-speed, SMU-per-pin parallel testing without the use of a host computer. All channels are independently controlled simultaneously at <500 ns.
- Eliminates time-consuming bus communication with PCs
- TSP Script Code for Compatible Instruments 2602B SourceMeter
- Connects up to 32 TSP-Link nodes or 64 independent SMU channels
- Easy reconfiguration as test requirements change
| model number | conduit | Maximum Current Source/range (of scales or measuring equipment) | Maximum Voltage Source/range (of scales or measuring equipment) | Measurement resolution (current)/(Voltage) | power supply | quote |
|---|---|---|---|---|---|---|
| 2606B | 4 | 3A | 20V | 100fA / 100nV | 20 W | - |
Production Testing of Laser Diodes (VCSEL) for 3D Sensing Applications
DC test systems for laser diode (LD) production testing utilize high-speed, high-precision SMUs for current sourcing and voltage-current monitoring of laser diode module photodiode currents. The SMU is the most cost-effective LIV instrument with high system synchronization and throughput.
- Programmable current source up to 3 A current and 100 µs pulse width
- Voltage and current measurement resolution of 100 nV and 0.1 fA
- Built-in TSP processing reduces PC instrument bus communications
High Volume Production Testing of LEDs
The 2606B SMU is the industry's leading instrument for LED DC qualification and production testing. It can be configured to source current or voltage and combines voltage and current measurements with 0.015% basic measurement accuracy to meet a wide range of test needs. In addition, Test Script Processor (TSP®) technology provides throughput benefits.
- Programmable current source up to 3 A current and 100 µs pulse width
- Voltage and current measurement resolution of 100 nV and 0.1 fA
- Built-in TSP processing reduces PC instrument bus communications
- Daisy chain up to 64 channels for high-volume parallel testing
Calibrating Transistors with Multi-Channel SMU Instruments
With its integrated sources and measurements, voltage or current, precision and accuracy, the 2606B System SourceMeter SMU instrument is ideally suited to measure transistors on a wafer or within a packaged part, including capturing leakage waveform series, threshold voltages, gate leakage and transconductance.
- Programmable current source up to 3 A current and 100 µs pulse width
- Voltage and current measurement resolution of 100 nV and 0.1 fA
- Best accuracy 0.015%, 6½ bit resolution
- Built-in TSP processing reduces PC instrument bus communications
