TH2840NX Automatic Transformer Test System
TH2840NX Automatic Transformer Test System
TH2840NX Automatic Transformer Test System
TH2840NX Automatic Transformer Test System
TH2840NX Automatic Transformer Test System
TH2840NX Automatic Transformer Test System

TH2840NX Automatic Transformer Test System

TH2840X series automatic transformer test system is Changzhou Tonghui Electronics in many years of experience in transformer testing, the use of a new generation of technology to succeed in a new generation of automatic transformer test system, innovative use of dual-CPU architecture, the underlying system of Linux, 10.1-inch capacitive touch screen, Chinese and English operating interface, built-in instructions and help and other new generation of technology, to solve the previous test The system setup is cumbersome, the test speed is slow, the display is complementary, the PIN foot position is insufficient and other defects.

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TH2840X series automatic transformer test system is Changzhou Tonghui Electronics in many years of experience in transformer testing, the use of a new generation of technology to succeed in a new generation of automatic transformer test system, innovative use of dual-CPU architecture, the underlying system of Linux, 10.1-inch capacitive touch screen, Chinese and English operating interface, built-in instructions and help and other new generation of technology, to solve the previous test The system setup is cumbersome, the test speed is slow, the display is complementary, the PIN foot position is insufficient and other defects.

TH2840X series automatic transformer test system benefits from the use of a 10.1-inch, resolution up to 1280 * 800 capacitive touch screen, you can set all the feet, test conditions, feet in series and parallel, balance settings, etc., the same screen operation, to simplify the setup process, and reduces the difficulty of the instrument operator to set up.

A. Revolutionary design

Dual-CPU architecture, Linux underlying, support for touch screen, keyboard, mouse, built-in Chinese and English help and other design, bringing an unparalleled operating experience, the

Significantly reduces the barrier to entry for operators and improves testing efficiency several times over.

The following is a comparison between the classic TH2829X and the latest model.

sports event TH2840X TH2829X
test speed Fast 21ms (100Hz), 50 cycles/sec (x8x)

Fast 3ms (1kHz), 300 cycles/sec (x5x)

Fast 3ms (10kHz), 300 cycles/sec (x1.5x)

Fast +2ms (>=2kHz), 500 cycles/sec (x2.5x)

Fast +150ms (100Hz), 6.6 times/second

Fast +15ms (1kHz), 66 times/second

Fast +5ms (10kHz), 200 cycles/sec.

Test Frequency ----

500kHz

2MHz

200kHz

500kHz

1MHz

test level AC20V(20Hz~1MHz)

AC15V(1MHz~2MHz)

AC10V
Built-in DC bias Bias voltage ±40V Bias voltage ±10V
Built-in bias current source 2A (standard), 10V supply voltage 2A (optional), 8V supply voltage
Support for scanning feet

 

24PIN (TH1831 scanner box)

48X6PIN (up to 288PIN) Host Universal

20PIN

48PIN

NX (up to 192PIN)

USB HOST interface 2 pcs, support mouse, keyboard 1
system architecture Dual-CPU solution to save display time single CPU
embedded system Linux system

Perfectly supports all kinds of USB flash drives

Support Network

Support mouse, keyboard operation, support capacitive touch screen

unsystematic
monitor (computer) 10.1-inch capacitive touchscreen 1280 x 800 display for more information 7-inch TFT display
Range switching Electronic switch, fast speed, long life, no noise Relay, slow, short life span
Number of documents 400 (288PIN) 20 (NX192PIN)
hand Electronic instruction manual, view brief description directly on the instrument not have

B.10.1-inch large screen, simplify the setup efficiency, reduce the operation difficulty

10.1-inch touch screen, 1280 * 800 resolution, touch the large screen to bring more benefits is that all the transformer feet associated with the test parameters, feet in series and parallel, sorting parameters and other parameters placed on the same screen, directly with the hand or keyboard and mouse operation, not only fast operation and looks like by no means crowded and cluttered.

According to the cultivation of Tonghui Electronics in the field of transformer test for more than ten years, it has been continuously improving for the problems encountered in the test of the early automatic transformer comprehensive test system.

1. Graphical transformer foot position association page

Early automatic transformer test system foot associated with the page setup is cumbersome, and can not be the first time the transformer foot, test fixture foot one-to-one correspondence, setup difficulties

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For this drawback, a new generation of automatic transformer test system in the foot associated interface increased picture, color, frame line and other elements to enhance the foot set up and test the correlation of the bullhorn, the user can be the first time the transformer foot associated with the physical object, reduce the difficulty of setting and wiring errors possible!

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2. Single page setup transformer test conditions

Early automatic transformer test systems need to enter different setting pages to set test parameters, such as setting Lx parameters, need to enter 6-7 different sub-pages, quite cumbersome.

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After improvement, now multiple parameters can be switched in one page, and all the related parameters of Lx can be set up in one table, which is clear at a glance and greatly improves the setting efficiency.

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3. Improvement of serial and parallel setting of the foot position

When setting the footer for earlier models, you need to go to different sub-pages for serial and parallel footers.

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Improved to set up the footer series and parallel connections directly in one page.

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4. Improved multi-foot input method

In transformer scanning settings, it is often necessary to enter a number of consecutive foot inputs such as 1,2,3,4,5,6, so the input method has been improved to use the customary way of inputs such as 1~6 to indicate the consecutive way of inputs, which simplifies the display page and improves the efficiency of inputs.

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5. Increase the average number of times and delay settings for each scanning parameter to increase stability.

In the transformer scanning test, due to some of the inductance circuit inductance is large, need to be stabilized after a certain period of time to read the accurate value, for this situation, each scanning parameter to increase the average number of times and delay settings to increase the stability, and at the same time will not affect the speed of the other parameters of the test.

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6. Improve the leakage sense setting method

When testing leakage inductance Lk in multiple windings, earlier instruments needed to constantly switch between corresponding windings and set the nominal value and limit value, which was very troublesome. The new generation of automatic transformer test system improves this setup by setting the foot position and connection mode of different secondary windings directly in the same setup page, eliminating the need to input the leakage inductance pins, and inputting the nominal value, upper and lower limits directly at the corresponding pins.

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7. Improved balanced scanning method

When testing the balance of multi-winding transformers, just like testing leakage inductance, earlier instruments needed to constantly switch the secondary balance foot position and set the corresponding limit value, the new generation of automatic transformer test system has improved this setting, all the balance setting items can be set up in the same page, and in response to the shortcomings of the earlier balancing points of up to 5 points, it has been upgraded to 10 points.

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C.LCR measurement function

1. This function is optional

2. Please refer to TH2840 series LCR digital bridge technical parameters for detailed functions and indicators.

Product Model TH2840AX TH2840BX TH2840NX
 

demonstrate

monitor (computer) 10.1-inch (diagonal) capacitive touch screen
proportions 16:9
resolution (of a photo) 1280×RGB×800
 

 

 

 

 

 

Test Frequency

realm 20Hz-500kHz 20Hz-2MHz 20Hz-500kHz
accurate 0.01%
 

 

 

 

 

resolution (of a photo)

0.1mHz (20.0000Hz-99.9999Hz)
1mHz (100.000Hz-999.999Hz)
10mHz (1.00000kHz-9.99999kHz)
100mHz (10.0000kHz-99.9999kHz)
1Hz (100.000kHz-999.999kHz )
10Hz (1.00000MHz-2.00000MHz)
 

 

AC Test Signal Mode

Rated value (ALCOFF) The set voltage is the Hcur voltage when the test terminal is open circuit
The set current is the current from Hcur when the test terminal is short-circuited.
constant value

(ALCON)

Keep the voltage on the DUT the same as the set value
Keep the current on the DUT the same as the set value
 

 

 

 

 

 

 

 

 

 

 

test level

voltage range 5mVrms-20Vrms F≤1MHz 5mVrms-20Vrms

F>1MHz 5mVrms-15Vrms

5mVrms-20Vrms
accuracy ± (10% x setpoint + 2mV) (AC ≤ 2Vrms)

± (10% x setpoint + 5mV) (AC > 2Vrms)

 

 

 

 

resolution (of a photo)

1mVrms (5mVrms-0.2Vrms)
1mVrms (0.2Vrms-0.5Vrms)
1mVrms(0.5Vrms-1Vrms)
10mVrms (1Vrms-2Vrms)
10mVrms (2Vrms-5Vrms)
10mVrms (5Vrms-10Vrms)
10mVrms(10Vrms-20Vrms)
current range 50μArms-100mArms
 

 

Resolution (100Ω internal resistance)

10μArms(50μArms-2mArms)
10μArms(2mArms-5mArms)
10μArms(5mArms-10mArms)
100μArms (10mArms-20mArms)
100μArms (20mArms-50mArms)
100μArms (50mArms-100mArms)
 

 

RDC Testing

voltage range 100mV-20V
resolution (of a photo) 1mV(0V-1V)
10mV(1V-20V)
current range 0mA-100mA
resolution (of a photo) 10μA(0mA-10mA)
100μA (10mA-100mA)
 

 

 

 

DC Bias

voltage range 0V-±40V
accuracy AC≤2V 1%×set voltage+5mV
AC>2V 2% x set voltage +8mV
resolution (of a photo) 1mV (0V - ±1V)
10mV (±1V - ±40V)
current range 0mA-±100mA
resolution (of a photo) 10μA (0mA-10mA)
100μA (10mA-100mA)
 

Built-in current source

current range 0mA-2A
accuracy I>5mA ± (2% x setpoint + 2mA)
resolution (of a photo) 1mA
Output Impedance 30Ω, ±4 @1kHz
100Ω, ±2 @1kHz
LCR Module Measurement Parameters
 

measured parameter

way (of life) Four parameters can be selected arbitrarily
AC Cp/Cs, Lp/Ls, Rp/Rs, |Z|, |Y|, R, X, G, B, θ, D, Q, VAC, IAC
DC RDC, VDC, IDC
Test Side Configuration four-pronged attack (e.g. marriage)
Test cable length 0m, 1m, 2m, 4m
mathematical operation Absolute deviation from nominal value Δ, percentage deviation from nominal value Δ%
equivalence mode Series, parallel
calibration function Open OPEN, Short SHORT, Load LOAD
Measured average 1-255 times
Range Selection Auto AUTO, Manual HOLD
Range Configuration LCR 100mΩ, 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ
RDC 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ
 

Measurement time (ms)

Fast+: 0.56ms

Fast: 3.3ms

Medium speed: 90ms

Slow: 220ms

Maximum accuracy 0.05% (refer to specifications)
Measurement display range
Cs, Cp 0.00001pF-9.99999F
Ls, Lp 0.00001μH-99.9999kH
D 0.00001-9.99999
Q 0.00001-99999.9
r, rs, rp, x, z, rdc 0.001mΩ-99.9999MΩ
G, B, Y 0.00001μs-99.9999S
VDC ±0V-±999.999V
IDC ±0A-±999.999A
θr -3.14159-3.14159
θd -179.999°-179.999°
Δ% ± (0.000%-999.9%)
TurnsRatio 1:0.001-1000:1
For other test parameters of LCR module, please refer to TH2840 series LCR digital bridge technical parameters section.
Transformer Measurement
 

 

test parameter

Cs/Cp: Capacitance, Ls/Lp: Inductance, DCR: DC Resistance, Zx: Impedance, Rs/Rp: Resistance, D: Loss, Q: Quality Factor, dZ: Phase Angle, Lk: Leakage Inductance, Phase: Phase), Balance: Balance

Turns-Ratio: Ns:Np=U2/U1, Np:Ns=U1/U2 Turns (number of turns): Ns=Np×U2/U1, Np=Ns×U1/U2

test pattern progression In the single trigger mode, manually triggered once, measured all the test parameters of the transformer set once.
one-step In the single-trigger mode, manually trigger once to measure a measurement parameter of the transformer, and trigger again to measure the next parameter.
 

Measurement time (ms)

speedy Fast: 3.3ms, Fast+: 1ms (>10kHz)
medium speed Medium speed: 90ms
slow speed Slow: 220ms
bias source Reference bias section parameters
Average number of times Each test parameter can be set to a different average number of times, the average number of times for 0-255
latency Different delay times can be set for each test parameter.
Transformer Scanning
Built-in scanning channels (PIN) 6 x (24 x 2) = 288PIN (AX,BX without built-in scanner board)
Transformer HANDLE interface Pin Definitions NS1-NS30, GOOD, NG, TEST, Trigger, Reset (Consistent with TH2829X series) (NX) (AX,BX NSI-NS9)
Output Characteristics Optocoupler Isolated, ULN2003 Driver Enhanced, Collector Outputs
paradigm Direct reading, percentage
range (of scales or measuring equipment) Automatic, Hold
bias source Reference bias section parameters
External Scanner Box Compatible with TH1901 series, TH1831 scanner box
Number of windings junior ranking 60
secondary 9
Average number of times Each test parameter can be set to a different average number of times, the average number of times for 0-255
latency Different delay times can be set for each test parameter
 

Measurement time (ms)

speedy Fast: 3.3ms (≥1kHz), Fast+: 1ms (≥10kHz) (excluding relay action time)
medium speed Medium speed: 90ms
slow speed Slow: 220ms
Test Lead Interface 25*2pin FRC socket, pinout identical to TH2829 series (NX)
Other features and parameters
store a call (computing) inside (part, section) Approx. 100M non-volatile memory test setup file
External USB Test setup files, screenshot graphics, log files
Keyboard Lock Lockable front panel keys
 

 

 

 

connector

USB HOST 2 USB HOST ports, can be connected to the mouse, keyboard, U disk at the same time can only use a
USB DEVICE Universal Serial Bus socket, small Class B (4 contact positions); USBTMC-USB488 and USB2.0 compliant, female connector for connection to external controllers.
LAN 10/100BaseT Ethernet, 8-Pin, Speed Adaptive
HANDLER For Bin Staging Signal Output
External DC BIAS

containment

Supports TH1778A (transformer scanning is not supported)
RS232C Standard 9-pin, Crossed
RS485 Can receive conversion or external RS232 to RS485 module
Power-on warm-up time 60 minutes.
Input Voltage 100-120VAC/198-242VAC selectable, 47-63Hz
power wastage Not less than 130VA
Dimensions (WxHxD) mm3 430mm(W)x177mm(H)x265mm(D) 430mm(W)x177mm(H)x405mm(D)
Weight (kg) 11kg 17kg

■ Test speeds up to 0.56ms (1800 cycles/sec) (>10kHz) without relay action time

■ Test levels up to 20Vrms

■ Bias voltage is built-in ±40V/±100mA/2A

■ Up to 288 Pin Test Positions (TH2840NX only)

■ Industry-friendly user experience: Linux underpinnings, built-in help files

■ 10.1-inch 1280 x 800 capacitive touch screen

■ Graphical foot association setup page makes wiring less of a challenge

■ Lk setting is more intuitive without inputting leakage inductance pins.

■ Enhanced balance scanning from 5 to 10 points

■ range switching using electronic switches, fast, long life, no noise

■ Optional LCR function

■ About 100M setting file saving space in the machine, and a large amount of U disk setting file saving capacity.

■ Provide host computer support for early model file format conversion to ensure compatibility

■ Switching transformer scanning test, comprehensive characterization

■ Network transformer scanning tests, comprehensive characterization

■ Multi-scan testing of discrete passive components (inductors L, resistors R, capacitors C)

■ Multi-scan testing of relay driver packages, contact contact resistance

■ Multiple DC resistance DCR scan test

■ Comprehensive test analysis of multiple passive components in impedance networks

standard equipment
Accessory Name model number
Boxed Four-Ended Insulated Locking Kelvin Test Leads TH26011BS
Test Leads at Both Ends TH26004B
Foot-activated switch TH2829AX-001
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TH2840NX Automatic Transformer Test SystemTH2840NX Automatic Transformer Test System

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