RF LCR Meter Model 11090-030

Chroma 11090-030 RF LCR meter provides a solution for high frequency measurement and evaluation of passive components such as chip inductors and RF filters. With its high test frequency of 300MHz, it not only meets the increasing nominal frequency test for POL or general small DC-DC converter inductors, but also meets the quality abnormality that can only be detected by ultra-high frequency testing. In addition, it can also meet the demand of 100MHz impedance testing, which is commonly used by EMI-Filter, Ferrite Bead, and so on.

Covering measurement items Z, θz, Y, θy, R, X, G, B, Ls, Lp, Cs, Cp, Rs, Rp, D , Q and other passive components test required for the primary and secondary parameters. With a wide test frequency range of 100kHz~300MHz, the RF type current-voltage conversion technology is superior to the impedance measurement range of the network analyzer technology and higher than the frequency measurement range of the auto-balanced bridge technology, which is suitable for R&D and quality assurance units to analyze the characteristics of passive components at different frequencies. In addition, it is equipped with ultra-low noise and low harmonic distortion signal generation module, which gives high quality and purity to the measurement signal, thus enhancing the accuracy of impedance testing.

The basic measurement accuracy of 0.8% enables high stability and reliability of measurement results, and the 0.5ms fast measurement can be matched with automated machines, which can efficiently and significantly increase the output. Compatible with a variety of small SMD test fixtures, the use of improved downward pressure, can be rotated 90 degrees and only three steps to replace the test object (actual test about 40 seconds), which can help users to reduce the time to replace different sizes of the test object, accelerate the speed of testing, eliminating the need to repeatedly disassemble the limit shims, thus reducing the loss and subsequent customer maintenance costs.

The Chroma 11090-030 RF LCR meter is designed with comprehensive specifications and focused functionality enhancements to provide a complete test solution for product characterization and analysis, automated production line quick test, and various parts in/out management, offering you a brand new alternative to the few existing solutions in the market.

• Up to 300MHz test frequency
• Impedance Measurement and Accuracy
• Featured Functions
• Fast-operating SMD test fixtures
• standard transmission interface
• Panel Description

 

High-frequency miniaturized power inductors are mostly metal compression mode inductors, but ① poor original magnetic material (large metal particles/poor ferrite layer) or ② partial destruction of the ferrite layer after interlayer withstand voltage test or ③ coil varnish damage and direct contact with the magnetic material will result in a lower Q, and overheating is easy to occur in the subsequent use of the inductors. To detect these three types of anomalies, the nominal frequency of the general inductance of the test state, due to the inductive impedance state is low, the Q value is mostly by the probe contact resistance.

Therefore, increasing the test frequency and thus increasing the inductive resistance to reduce the impact of the probe contact resistance can improve the detection rate of magnetic material anomalies and wire insulation anomalies, and this method is widely used in the industry.

The surface of magnetically conductive metal powder is mostly treated with an oxide layer to reduce the eddy current loss brought about by high-frequency communication to improve the usable frequency range and reduce loss and temperature rise. However, the general user is unable to know from the appearance of the particle size of the magnetic material and whether the oxide layer is intact after sintering in the press mold, but it is easy to tell through the high-frequency test.

Inductance in the high frequency equivalent circuit and the relationship between Ls and Q such as (Figure 1), the general industry, although close to the inductor self-oscillation frequency (SRF) of the Ls in the detection of the aforementioned quality anomalies, essentially in the detection of its Q value is low, but can be avoided by the impact of the contact resistance. Generally, the Ls of normal products near the SRF is higher due to the parasitic capacity, while abnormal products are subject to low Q value due to excessive loss, and the apparent Ls is also low. Chroma11090-030 100kHz~300MHz test frequency range meets the dual testing needs of nominal Ls/Q and high frequency Ls@HF, which can meet the needs of this type of inductors in the production, and is also very suitable for its RD and QA or inductor users.

▲ (Fig. 1) Equivalent circuit of inductance at high frequency with Ls vs. Q

▲ (Fig. 2) The two curves are illustrated by taking samples and measuring them.