RP6060The probe provides a low noise, large bias range solution for measuring ripple on DC supply rails from -60 ~ +60 VDC. provides the industry leading low noise and large bias range required to measure AC ripple from 200 μVp-p ~ 800 mVp-p below 1 GHz. The probe is primarily intended for low source impedance measurements in the distribution plane, so it is not recommended to measure devices with source impedances >1 Ω as this may result in waveform distortion.
New features, higher densities, and faster switching speeds in modern electronics are driving the need for lower supply voltages. Designers need to zoom in on the power rails, look for high-frequency interference signals, measure ripple, and analyze coupling effects at tighter tolerances. Oscilloscopes typically do not have enough bias to shift the noise and ripple on the DC rails to the center of the screen to make the required measurements. the RP6060 probe provides a low-noise measurement solution (oscilloscope and probe), which is critical to differentiate between the noise of the oscilloscope and probe, and the noise and ripple of the DC power supply under test. The higher input impedance in the probe minimizes the effect of the oscilloscope load on the DC rail (50 kΩ). The higher the bandwidth provided by the probe, the more content (harmonics, faster ripple, etc.) that can be viewed on the DC track that may be affecting the data signals, clocks, and other signals.
Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
