Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
- Product Description
- Technical Parameters
- Performance Characteristics
- appliance
- Optional accessories
- Product Brochure
System components.
Xinrui Zhongke Dynamic Parameter Analyzer, which mainly includes PC, oscilloscope, low voltage source, high voltage DC source, probe, and other analyzers.
The SP26D semiconductor test system uses a 12-bit oscilloscope, which can correctly reflect
Accurate calculation of waveform details and parameters should be performed, and high-bandwidth voltage and current detection features are available for
SiC/GaN measurement requirements, and at the same time can meet the up/down tube test requirements, which can avoid frequent connection of probes. The
The system has a full range of measurement parameters and supports a wide range of device types.
Hardware Advantages.
- Adopt Tektronix world's most advanced 12 bit oscilloscope, test results more accurate
- High-bandwidth voltage detection to meet SIC/GAN measurement requirements
- Simultaneous testing of upper/lower tubes, avoiding frequent connection of probes
- Wide voltage coverage and scalable
- Device Driven Design Support for SIC/GAN Devices
- Can be customized according to customer requirements
- Temperature characterization of devices can be added
- Hardware can be upgraded for automated robots
Main system parameters
| name (of a thing) | instructions |
| Acquisition bandwidth | 500 MHz/1 GHz |
| sampling rate | 6.25Gsa/S |
| Line voltage | 5-2000V, expandable to 6000V |
| Voltage measurement | Maximum 2000V standard, 2% accuracy range, expandable to 7000V. |
| Current Measurement | Standard 300A, accuracy ±2%. expandable to 6000A. |
| short-circuit current | 2000A-10000A |
| drive voltage | ±24V |
| measured parameter | Vce/Vds, Ic/Id, Vgs/Vge, toff, td(off), tf(Ic),
Eoff, Ton, td(on), tr(Ic), Eon, dI/dt, dv/dt, Err, Qrr, trr, I rr, etc. |
| Measurement Objects | Switching parameters, reverse recovery parameters, short circuit parameters |
| measuring device | Single Tube/Module |
| pulse width | 20ns-1000us. |
| pulse number (math.) | Single pulse, 2-5 pulses |
| standard of measurement | iec60747-8, iec60747-9 |
| seal inside | TO-247, TO-220, EasyPack1B, etc. |
Test items
| Parameter classification | parameter symbol | Parameter description |
|
General parameters |
Vge/Vgs | drive voltage |
| Vce/Vds | Drain-Source Voltage | |
| Vce/Vds pk | Switching voltage max. | |
| Ic/Id pk | Maximum value of on-state current | |
|
Switching parameters |
td(on) | start-up delay |
| Tr | rising time | |
| Ton | activation time | |
| Eon | start-up energy | |
| td(off) | Closure delay | |
| Tf | descent time | |
| Toff | Closing time | |
| Eoff | off energy | |
| dv/dt | Rate of change of voltage | |
| di/dt | Rate of change of current | |
|
Reverse recovery parameters |
Trr | Reverse recovery time |
| Irr | Reverse recovery current | |
| Qrr | reverse charge recovery | |
| Err | Reverse energy recovery | |
| Id vs t | Reverse Recovery Current Characteristics | |
| Vsd | Parasitic diode forward conduction voltage | |
|
Short Circuit Parameters |
di/dt | Rate of change of current |
| Tsc | short circuit time | |
| Iscm | Short circuit saturation current | |
| Esc | short-circuit energy | |
| Psc | short-circuit power |
Software Features
- Complete measurement parameters: switching parameters, reverse recovery parameters, short circuit parameters, avalanche test
- Supports multiple device types: single tube/module, MOSFET, IGBT
- Offline data analysis: both online measurements and recorded data can be analyzed offline
- Test mode: single pulse, multi-pulse
- Flexible setting of test items
- Software with strong scalability
- Expanded support for measurement items and devices
Main Applications of SP26D Series
Incoming inspection of power semiconductors
② Dynamic Parameter Verification of Power Semiconductors
③ Laboratory device evaluation
④ Production inspection and screening of power semiconductors.
⑤ Laboratory drive design improvement
⑥ PCB design evaluation in the laboratory
SP26D Series Ordering Information
| model number | Test Chip Type | Acquisition bandwidth | Maximum voltage and current |
| SP26D054 | single tube | 500MHz | 2000V, 300A |
| SP26D054M | module (in software) | 500MHz | 2000V, 300A |
| SP26D104 | single tube | 1GHz | 2000V, 300A |
SP26D Semiconductor Dynamic Parameter Analysis System Configuration
- Configuration includes: 2000V bus voltage source, 500M bandwidth oscilloscope, TO247-3/TO220 package fixture;
- Probe system includes: 200MHz, 2000V high-voltage differential probe*2, 300A50MHz flexible current probe; optically isolated 500MHz differential probe
- SP26DD system software and manual.
