The truest signal presentation
The SigOFIT Optical Isolation Probe has an extremely high common mode rejection ratio, with a CMRR of up to 128dB at 100MHz and still up to 114dB at 500MHz, making it the ultimate judge of the authenticity of signals measured by other voltage probes.

Extremely high test accuracy and stability
As the ultimate judge of the authenticity of signals measured by other voltage probes, test accuracy is an important indicator of the SigOFIT optoisolated probe, which has excellent amplitude-frequency characteristics, DC gain accuracy better than 1%, noise floor less than 1.46mVrms, and zero drift after warm-up less than 500μV.

Optimal Test Means for Third Generation Semiconductors
Third-generation semiconductor devices due to the short on and off time, the signal has a faster rising edge and falling edge, the signal has a high energy of high-frequency harmonics, SigOFIT optical isolation probe in the highest bandwidth, but still has a common mode rejection ratio of more than 100dB, can be nearly perfect suppression of high-frequency common-mode noise generated by the oscillation of the signal presented by the signal without additional redundant components, it is the third-generation semiconductor It is the perfect choice for third-generation semiconductor testing.

Testing Gallium Nitride (GaN) without Blowing Tubes
SigOFIT optically isolated probes are safe for testing Gallium Nitride (GaN) with short test leads and coaxial transmission, and probe input capacitance as low as 2.6pF.

Flexible, efficient and easy to use
SigOFIT optical isolation probes are smaller than traditional high-voltage differential probes, and the probe leads are more compact, making them more flexible and convenient to use; the probes are fast-responding, power-on ready to measure, and calibration time is less than 1 second, which ensures accurate signal output in real time.

Wider test range
Unlike high-voltage differential probes that can only test high-voltage signals, SigOFIT optical isolation probes can test differential mode signals from ±1.25V to ±5000V by matching different attenuators and achieve full scale output to achieve a high signal-to-noise ratio.

application scenario
The SigOFIT Optical Isolation Probe can be used as the final arbiter when there is a question as to the accuracy and veracity of the results measured by other voltage probes.
Power Supply Device Evaluation, Current Parallel Measurement, EMI and ESD Troubleshooting
Motor drive design, power converter design, electronic ballast design
Design and analysis of Gallium Nitride, Silicon Carbide, and IGBT half/full bridge devices
Secure Isolation Testing for High Voltage High Bandwidth Test Applications
Testing of inverters, UPS and switching power supplies
Wide voltage, wide bandwidth test applications
Various Floating Ground Tests

| model number | OIP100B | OIP200B | OIP500B |
|---|---|---|---|
| bandwidths | 100MHz | 200MHz | 500MHz |
| rising time | ≤3.5ns | ≤1.75ns | ≤700ps |
| Common mode rejection ratio | DC: 180dB 100MHz: 128dB |
DC: 180dB 200MHz: 122dB |
DC: 180dB 500MHz: 114dB |
| differential mode voltage | ±5000V | ||
| bottom noise | <1.46mVrms | ||
| DC Gain Accuracy | 1% | ||
| common-mode voltage (electronics) | 85kVpk | ||
*Note: When purchasing the Optical Isolation Probe OIP B series (battery powered), please read the user manual carefully. It is strictly prohibited to charge the probe while it is powered on or connected to the circuit under test, otherwise it may cause damage to the probe or jeopardize personal safety.
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