TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System
TH2829NX Automatic Transformer Test System

TH2829NX Automatic Transformer Test System

■ 测试脚位:72/96/120/144/168/192 PIN

■ 测试频率:20Hz-200kHz, 分辨率:0.5mHz

■ Signal level: 5mV-2Vrms (2mV-10Vrms optional)

■ Test speed: as fast as 13ms

■ Diode forward/reverse characterization

■ Improved high turn ratio and weakly coupled transformer testing capabilities

▪ Improved DCR testing capabilities

■ Single screen for all scanning test results

■ Time-stamping system: memorization of file settings, calibration deviations and deduction of time

■ Multi-sorting with selected scanning parameters

■ Scanning fixture relay self-test function

▪ Flexible deviation deductions

■ Multiple options for handling defects

■ Single-parameter test cycles for test judgment of individual windings

▪ Increased security: two levels of passwords for administrators and operators

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Barcode reading directly recalls setup files to manage test product varieties

■ Optional PC-level instrument test setup file programming capability

■ Online upgrade mode: USBHOST or RS232

■ Supports multi-instrument networking via LAN interface.

■ Backward compatible with TH2818X/TH2819X parameter setup files

■ Storage: Internal: 100 sets of setting files saved

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TH2829NX Automatic Transformer Test System

Product Model TH2829LX TH2829AX TH2829AX-24 TH2829AX-48 TH2829NX TH2829BX TH2829CX
Test Pin Location (PIN) 20 20 24 48 72/96/120/144/168/192 20 20
Test Frequency 20Hz-200kHz 20Hz-500kHz 20Hz-1MHz
demonstrate 7-inch TFT LCD monitor 800 x RGB x 600
LCR function You can contact the salesman to purchase a permanent opening
Transformer test parameters turnover ratio number of laps phase (waves) inductors capacitors leakage quality factor alternating current (AC) resistance DC resistance equilibrium pin short diode forward and reverse
Turn Ratio Turns Phase L C Lk Q ACR DCR Balance Pin Short Diode P/N
LCR Test Parameters |Z|, |Y|,C,L,X,B,R,G,D,Q,θ,DCR,Turn-Ratio,Phase,Lk
Basic Measurement Accuracy LCRZ 0.05%
DCR, Turn Ratio 0.1%
Signal source output impedance 10Ω, 30Ω, 50Ω, 100Ω
Test speed (ms/test) 13ms,90ms,370ms
AC Signal Level 5mVrms- 2Vrms (transformer test, customizable to 10Vrms), 5mVrms- 10Vrms (LCR function); 50μArms- 100mArms
DC bias voltage source ------ 0V- ±10V; 0mA- ±100mA
DC bias current source 0 - ±1A option (option TH2901), 0 - ±2A (option TH2902)
DC constant current source 0mA- ±120mA for forward diode characterization
Diode Testing Forward Test Voltage 0-9.9999V
Reverse test current 0-99.999mA
comparator 10-speed sorting, PASS/FAIL indication and counting function.
stockpile Internal: 100 sets of setup files saved; USB flash drive: 500 sets of setup files, CSV format test data, GIF format images

■ 测试脚位:72/96/120/144/168/192 PIN

■ 测试频率:20Hz-200kHz, 分辨率:0.5mHz

■ Signal level: 5mV-2Vrms (2mV-10Vrms optional)

■ Test speed: as fast as 13ms

■ Diode forward/reverse characterization

■ Improved high turn ratio and weakly coupled transformer testing capabilities

▪ Improved DCR testing capabilities

■ Single screen for all scanning test results

■ Time-stamping system: memorization of file settings, calibration deviations and deduction of time

■ Multi-sorting with selected scanning parameters

■ Scanning fixture relay self-test function

▪ Flexible deviation deductions

■ Multiple options for handling defects

■ Single-parameter test cycles for test judgment of individual windings

▪ Increased security: two levels of passwords for administrators and operators

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Barcode reading directly recalls setup files to manage test product varieties

■ Optional PC-level instrument test setup file programming capability

■ Online upgrade mode: USBHOST or RS232

■ Supports multi-instrument networking via LAN interface.

■ Backward compatible with TH2818X/TH2819X parameter setup files

■ Storage: Internal: 100 sets of setting files saved

■ 开关变压器扫描测试、综合特性分析。
■ Network transformer scanning tests, comprehensive characterization
■ Multi-scan testing of discrete passive components (inductors L, resistors R, capacitors C)
■ Multi-scan testing of relay driver packages, contact contact resistance
■ Multiple DC resistance DCR scan test
■ Comprehensive test analysis of multiple passive components in impedance networks

standard equipment
Accessory Name model number
Test Leads at Both Ends TH26004B
Foot-activated switch TH2829AX-001
Boxed Four-Ended Insulated Locking Kelvin Test Leads TH26011AS
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TH2829NX Automatic Transformer Test SystemTH2829NX Automatic Transformer Test System

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