P Series High Accuracy Benchtop Pulse Source Meter

*The above specifications are subject to update without prior notice.

Why choose the P-Series High Accuracy Benchtop Pulse Source Meter?

• performances-Excellent full-scale test/readback accuracy of 0.1% and wide dynamic range specifications (up to 300V down to 1pA) enable fast and efficient execution of accurate characterization of semiconductor electrical properties.
• efficiency of productionThe -P series pulse source meters operate in the four-quadrant region, and the full range of models offers both DC and pulse modes; SCPI commands provide versatility and compatibility. Users can operate measurements efficiently and keep up with evolving semiconductor technology.
• expertise-As the first high-tech enterprise to industrialize the digital source meter SMU, the team of R&D and product experts has been listening to the needs of users and continuously providing innovative and effective solutions to customers' measurement challenges.

Integrated source and meter capability for ultimate simplicity in IV measurement tasks

Characterizing semiconductor electrical properties using traditional instruments such as voltage/current sources, arbitrary waveform generators (AWGs), switches, and voltage/current meters is complex and costly. Multiple instruments are required to complete the test, and programming, synchronizing, connecting, measuring, and analyzing the different instruments is complex, time-consuming, and takes up a lot of test bench space.

The Purcell P-Series Pulse Source Meter integrates many different sources and measurement capabilities into a compact instrument chassis and can operate as a stand-alone constant voltage or constant current source, voltmeter, ammeter, and ohmmeter, as well as a precision electronic load, pulse generator, and AWG. The versatile, all-in-one capability of the Purcell P-Series SMU allows it to perform a wide range of measurements from DC to low-frequency AC without the need to change connections or use additional equipment.

Wide dynamic range for fast and accurate measurement results

The Purcell P-Series pulse source meters offer maximum voltages of ±300 V, maximum currents of ±1 A DC, ±10 A pulse, and resolutions as low as 1 pA. The P-Series pulse source meters can store up to 100,000 data points and support batch readout of the buffer at the same time as the measurement, reducing bus communication time. When integrated into semiconductor test systems, these features will help users greatly improve test efficiency.

Four-quadrant operation, either as source or load

Power quadrant refers to the quadrant diagram formed by taking the output voltage of the power supply as the X-axis and the output current as the Y-axis. The first and third quadrant that the voltage and current isotropic, the source meter to other equipment power supply, known as the source mode; the second and fourth quadrant that the voltage and current is inverse, other equipment to the source meter discharge, the source meter passive absorption of the inflow of current, and can provide a return path for the current, known as the trap mode.

Built-in Sweep and Arbitrary Waveform Measurement Functions

P series high precision pulse source meter has built-in scanning function, supporting linear and logarithmic scanning, customized scanning and sequence scanning. By setting the function relationship and protection parameters, the system operates automatically and can effectively execute the output of arbitrary curves, which can greatly improve the testing efficiency in tests that characterize the response changes with voltage or current, and is ideal for the characterization of I-V, I-R, and V-R properties.

The P-Series high-precision pulse source meters feature Arbitrary Waveform Generation (AWG) and List Sweep functions.The AWG and List Sweep functions enable you to create waveforms of up to 100,000 steps for maximum flexibility.

Simultaneous pulse measurement of multiple voltages and currents to reduce device self-heating effects

Heat management is critical in the testing of many devices, especially those at the semiconductor wafer level, such as VCSELs, laser diodes, and LEDs. pulsed I-V testing minimizes the heating effect of device currents. the P-Series of high-precision pulsed source meters minimizes the heating effect of wafers and makes it easier to perform real device testing, ensuring accurate measurements for the user.

Easily meets common measurement needs

Touch any icon on the screen to bring up the graphical setup screen. Follow the wizard to set up one by one before measurement for more intuitive operation.

Applications offered

- Sequence scanning

- Data Logger: Continuous Output Constant Voltage Source Test Mode; Continuous Output Constant Current Source Test Mode

- APD tube

- Transistors: MOSFET tube test; Triode test

-- LIV: PIN Tube Scan Test

- Waveform generator: set up four kinds of waveforms: sine, triangle, square and sawtooth; DC mode output and pulse mode output; customized sequence can be set up