Electrical Dual Layer Capacitance Automatic Test System Model 8801

The Chroma 8801 Electrical Dual Layer Capacitance Automated Test System is the ultimate solution for Electrical Dual Layer Capacitance (EDLC) testing. With a wide range of hardware to choose from, the system includes a programmable DC power supply, programmable DC electronic load, timing analyzer and LCR meter. The system is comprised of open-architecture software, giving the user more flexibility in combining powerful and cost-effective test systems for a wide range of electrical double layer capacitance (EDLC) applications on the market.

The Chroma 8801 Electrical Double Layer Capacitor Automatic Test System (EDLC ATS) provides a unique and highly efficient test command technology that avoids the repetition of the same control commands to the system's hardware devices, thus significantly increasing test speed. This makes the 8801 the perfect choice for high-speed production applications.

The Chroma 8801 Electrical Dual Layer Capacitance Automated Test System includes sophisticated test execution procedures that meet the specifications of the EIAJ RC-2377 standard. The system provides special test editing functions that allow the user to create new test programs according to their own needs, and also gives the user the ability to expand the test database without limitations.

The system's open architecture software also includes statistical analysis and management capabilities. These features enable the system to generate a wide variety of test files and perform system management. The statistical reports provided by the system are indispensable, which is extremely important for quality assurance and production testing in modern factories. The Chroma 8801 EDLC test system is designed to work with Windows R2000/XP or above, providing test engineers with an easy-to-learn window environment and allowing the use of system resources provided by Microsoft.

This automated test system uses a unique perfect test command technology to avoid duplicate control commands being sent to the system hardware device, which enables the system to greatly increase the test speed, and an open software architecture, constituting a highly efficient and perfect EDLC automated test system.